In this study, we simulated gas bubble formation in glasses by in-situ ion implantation. Alkali silicate glass and Na-borosilicate glass were implanted in situ with 50 keV Xe ions at temperatures at 200°C in a Hitachi-9000 electron microscope. Bubble formation was studied by transmission electron microscopy images taken during interruptions of the ion beam after discrete implanted-ion dose steps. We present a possible mechanism of bubble formation and growth based on amorphous network structures.
|Number of pages
|Materials Research Society Symposium - Proceedings
|Published - 1 Dec 1998
|1998 MRS Fall Meeting: Symposium N / Microstructural Processes in Irradiated Materials - Boston, United States
Duration: 30 Nov 1998 → 3 Dec 1998