Calibration and verification of areal surface texture measuring instruments

Richard K. Leach, C. L. Giusca, H. Haitjema, C. Evans, X. Jiang

Research output: Contribution to journalArticle

37 Citations (Scopus)

Abstract

In this paper, the calibration and verification infrastructure to support areal surface texture measurement and characterisation will be reviewed. A short historical overview of the subject will be given, along with a discussion of the most common instruments and directions of current international standards. Traceability and uncertainty will be discussed, followed by a presentation of the latest developments in software and material measurement standards. The concept and current infrastructure for determining the metrological characteristics of instruments will be highlighted and future research requirements will be presented.

LanguageEnglish
Pages797-813
Number of pages17
JournalCIRP Annals - Manufacturing Technology
Volume64
Issue number2
DOIs
Publication statusPublished - 2015

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Textures
Calibration
Uncertainty

Cite this

Leach, Richard K. ; Giusca, C. L. ; Haitjema, H. ; Evans, C. ; Jiang, X. / Calibration and verification of areal surface texture measuring instruments. In: CIRP Annals - Manufacturing Technology. 2015 ; Vol. 64, No. 2. pp. 797-813.
@article{3a312c0343594c41b1ea4e86538fa5b2,
title = "Calibration and verification of areal surface texture measuring instruments",
abstract = "In this paper, the calibration and verification infrastructure to support areal surface texture measurement and characterisation will be reviewed. A short historical overview of the subject will be given, along with a discussion of the most common instruments and directions of current international standards. Traceability and uncertainty will be discussed, followed by a presentation of the latest developments in software and material measurement standards. The concept and current infrastructure for determining the metrological characteristics of instruments will be highlighted and future research requirements will be presented.",
keywords = "Calibration, Topography, Uncertainty",
author = "Leach, {Richard K.} and Giusca, {C. L.} and H. Haitjema and C. Evans and X. Jiang",
year = "2015",
doi = "10.1016/j.cirp.2015.05.010",
language = "English",
volume = "64",
pages = "797--813",
journal = "CIRP Annals - Manufacturing Technology",
issn = "0007-8506",
publisher = "Elsevier USA",
number = "2",

}

Calibration and verification of areal surface texture measuring instruments. / Leach, Richard K.; Giusca, C. L.; Haitjema, H.; Evans, C.; Jiang, X.

In: CIRP Annals - Manufacturing Technology, Vol. 64, No. 2, 2015, p. 797-813.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Calibration and verification of areal surface texture measuring instruments

AU - Leach, Richard K.

AU - Giusca, C. L.

AU - Haitjema, H.

AU - Evans, C.

AU - Jiang, X.

PY - 2015

Y1 - 2015

N2 - In this paper, the calibration and verification infrastructure to support areal surface texture measurement and characterisation will be reviewed. A short historical overview of the subject will be given, along with a discussion of the most common instruments and directions of current international standards. Traceability and uncertainty will be discussed, followed by a presentation of the latest developments in software and material measurement standards. The concept and current infrastructure for determining the metrological characteristics of instruments will be highlighted and future research requirements will be presented.

AB - In this paper, the calibration and verification infrastructure to support areal surface texture measurement and characterisation will be reviewed. A short historical overview of the subject will be given, along with a discussion of the most common instruments and directions of current international standards. Traceability and uncertainty will be discussed, followed by a presentation of the latest developments in software and material measurement standards. The concept and current infrastructure for determining the metrological characteristics of instruments will be highlighted and future research requirements will be presented.

KW - Calibration

KW - Topography

KW - Uncertainty

UR - http://www.scopus.com/inward/record.url?scp=84940039655&partnerID=8YFLogxK

U2 - 10.1016/j.cirp.2015.05.010

DO - 10.1016/j.cirp.2015.05.010

M3 - Article

VL - 64

SP - 797

EP - 813

JO - CIRP Annals - Manufacturing Technology

T2 - CIRP Annals - Manufacturing Technology

JF - CIRP Annals - Manufacturing Technology

SN - 0007-8506

IS - 2

ER -