Calibration of step heights and roughness measurements with atomic force microscopes

J. Garnaes, N. Kofod, A. Kühle, C. Nielsen, K. Dirscherl, L. Blunt

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)

Fingerprint Dive into the research topics of 'Calibration of step heights and roughness measurements with atomic force microscopes'. Together they form a unique fingerprint.

Engineering & Materials Science