Characterisation and analysis of micro-contaminants in industrial polymers: Application of TP-SIP-MS scanning electron microscopy and SEM X-ray microanalysis

P. A. Barnes, G. M. Parkes, P. Sheridan

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Analysis of very small particles can present problems. This paper describes the application of temperature programmed solid insertion probe mass spectrometry (TP-SIP-MS), scanning electron microscopy and SEM X-ray microanalysis to the identification of foreign particles present in an industrial product. The relative advantages and limitations of the techniques are discussed. It is shown that TP-SIP-MS is a powerful tool for such work and complements the use of more conventional microanalytical methods.

LanguageEnglish
Pages841-854
Number of pages14
JournalJournal of Thermal Analysis
Volume42
Issue number5
DOIs
Publication statusPublished - 1 Nov 1994
Externally publishedYes

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Microanalysis
microanalysis
contaminants
Mass spectrometry
insertion
Polymers
mass spectroscopy
Impurities
X rays
Scanning electron microscopy
scanning electron microscopy
probes
polymers
complement
x rays
Temperature
temperature
products

Cite this

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abstract = "Analysis of very small particles can present problems. This paper describes the application of temperature programmed solid insertion probe mass spectrometry (TP-SIP-MS), scanning electron microscopy and SEM X-ray microanalysis to the identification of foreign particles present in an industrial product. The relative advantages and limitations of the techniques are discussed. It is shown that TP-SIP-MS is a powerful tool for such work and complements the use of more conventional microanalytical methods.",
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AB - Analysis of very small particles can present problems. This paper describes the application of temperature programmed solid insertion probe mass spectrometry (TP-SIP-MS), scanning electron microscopy and SEM X-ray microanalysis to the identification of foreign particles present in an industrial product. The relative advantages and limitations of the techniques are discussed. It is shown that TP-SIP-MS is a powerful tool for such work and complements the use of more conventional microanalytical methods.

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KW - scanning electron microscopy

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KW - X-ray

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