Abstract
Analysis of very small particles can present problems. This paper describes the application of temperature programmed solid insertion probe mass spectrometry (TP-SIP-MS), scanning electron microscopy and SEM X-ray microanalysis to the identification of foreign particles present in an industrial product. The relative advantages and limitations of the techniques are discussed. It is shown that TP-SIP-MS is a powerful tool for such work and complements the use of more conventional microanalytical methods.
Original language | English |
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Pages (from-to) | 841-854 |
Number of pages | 14 |
Journal | Journal of Thermal Analysis |
Volume | 42 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Nov 1994 |
Externally published | Yes |