Characterisation and analysis of micro-contaminants in industrial polymers: Application of TP-SIP-MS scanning electron microscopy and SEM X-ray microanalysis

Physics & Astronomy

• microanalysis 76%
• contaminants 73%
• insertion 70%
• mass spectroscopy 69%
• scanning electron microscopy 46%
• probes 43%
• polymers 41%
• characterization 39%
• complement 37%
• x rays 32%
• products 23%
• temperature 21%

Engineering & Materials Science

• Microanalysis 100%
• Mass spectrometry 92%
• Impurities 69%
• X rays 65%
• Characterization (materials science) 62%
• Scanning electron microscopy 56%
• Polymers 52%
• Temperature 28%

Chemistry

• X-Ray Microanalysis 91%
• Mass Spectrometry 48%
• Probe 43%
• Scanning Electron Microscopy 42%
• Application 22%