Characterisation of individual areal features

Nicola Senin, Liam Blunt

Research output: Chapter in Book/Report/Conference proceedingChapter

15 Citations (Scopus)

Abstract

Along with the characterisation of areal surface topography through texture parameters, surface metrology is increasingly facing challenges related to the dimensional and geometric characterisation of individual surface features. Typical scenarios range from the inspection of individual elements of micro-parts and devices, to the characterisation of pattern units in structured surfaces, and to the analysis of scratches, pores, bumps and other singularities either generated by the manufacturing process, or originated during the operational life of the surface. The characterisation of individual surface features opens up a wide array of new application scenarios and creates novel challenges for surface metrology. Early approaches are not as consolidated as what is available for the characterisation of surface texture and see the convergence of mathematical models, methods and algorithmic solutions coming from heterogeneous disciplines such as image processing, computer vision, coordinate metrology, reverse engineering, and computer-aided design. In this chapter an overview of the tools available in current surface metrology software is provided first. Then, the main challenges and open issues of achieving full metrological characterisation of individual surface features are introduced and discussed, as well as the current research approaches addressing them.

LanguageEnglish
Title of host publicationCharacterisation of Areal Surface Texture
EditorsRichard Leach
PublisherSpringer-Verlag Berlin Heidelberg
Pages179-216
Number of pages38
ISBN (Electronic)9783642364587
ISBN (Print)3642364578, 9783642364570
DOIs
Publication statusPublished - 1 Jun 2013

Fingerprint

Textures
Reverse engineering
Surface topography
Computer vision
Computer aided design
Image processing
Inspection
Mathematical models

Cite this

Senin, N., & Blunt, L. (2013). Characterisation of individual areal features. In R. Leach (Ed.), Characterisation of Areal Surface Texture (pp. 179-216). Springer-Verlag Berlin Heidelberg. https://doi.org/10.1007/978-3-642-36458-7_8
Senin, Nicola ; Blunt, Liam. / Characterisation of individual areal features. Characterisation of Areal Surface Texture. editor / Richard Leach. Springer-Verlag Berlin Heidelberg, 2013. pp. 179-216
@inbook{e0e21e1c42f14f3f9577acba4f0178b6,
title = "Characterisation of individual areal features",
abstract = "Along with the characterisation of areal surface topography through texture parameters, surface metrology is increasingly facing challenges related to the dimensional and geometric characterisation of individual surface features. Typical scenarios range from the inspection of individual elements of micro-parts and devices, to the characterisation of pattern units in structured surfaces, and to the analysis of scratches, pores, bumps and other singularities either generated by the manufacturing process, or originated during the operational life of the surface. The characterisation of individual surface features opens up a wide array of new application scenarios and creates novel challenges for surface metrology. Early approaches are not as consolidated as what is available for the characterisation of surface texture and see the convergence of mathematical models, methods and algorithmic solutions coming from heterogeneous disciplines such as image processing, computer vision, coordinate metrology, reverse engineering, and computer-aided design. In this chapter an overview of the tools available in current surface metrology software is provided first. Then, the main challenges and open issues of achieving full metrological characterisation of individual surface features are introduced and discussed, as well as the current research approaches addressing them.",
author = "Nicola Senin and Liam Blunt",
year = "2013",
month = "6",
day = "1",
doi = "10.1007/978-3-642-36458-7_8",
language = "English",
isbn = "3642364578",
pages = "179--216",
editor = "Richard Leach",
booktitle = "Characterisation of Areal Surface Texture",
publisher = "Springer-Verlag Berlin Heidelberg",

}

Senin, N & Blunt, L 2013, Characterisation of individual areal features. in R Leach (ed.), Characterisation of Areal Surface Texture. Springer-Verlag Berlin Heidelberg, pp. 179-216. https://doi.org/10.1007/978-3-642-36458-7_8

Characterisation of individual areal features. / Senin, Nicola; Blunt, Liam.

Characterisation of Areal Surface Texture. ed. / Richard Leach. Springer-Verlag Berlin Heidelberg, 2013. p. 179-216.

Research output: Chapter in Book/Report/Conference proceedingChapter

TY - CHAP

T1 - Characterisation of individual areal features

AU - Senin, Nicola

AU - Blunt, Liam

PY - 2013/6/1

Y1 - 2013/6/1

N2 - Along with the characterisation of areal surface topography through texture parameters, surface metrology is increasingly facing challenges related to the dimensional and geometric characterisation of individual surface features. Typical scenarios range from the inspection of individual elements of micro-parts and devices, to the characterisation of pattern units in structured surfaces, and to the analysis of scratches, pores, bumps and other singularities either generated by the manufacturing process, or originated during the operational life of the surface. The characterisation of individual surface features opens up a wide array of new application scenarios and creates novel challenges for surface metrology. Early approaches are not as consolidated as what is available for the characterisation of surface texture and see the convergence of mathematical models, methods and algorithmic solutions coming from heterogeneous disciplines such as image processing, computer vision, coordinate metrology, reverse engineering, and computer-aided design. In this chapter an overview of the tools available in current surface metrology software is provided first. Then, the main challenges and open issues of achieving full metrological characterisation of individual surface features are introduced and discussed, as well as the current research approaches addressing them.

AB - Along with the characterisation of areal surface topography through texture parameters, surface metrology is increasingly facing challenges related to the dimensional and geometric characterisation of individual surface features. Typical scenarios range from the inspection of individual elements of micro-parts and devices, to the characterisation of pattern units in structured surfaces, and to the analysis of scratches, pores, bumps and other singularities either generated by the manufacturing process, or originated during the operational life of the surface. The characterisation of individual surface features opens up a wide array of new application scenarios and creates novel challenges for surface metrology. Early approaches are not as consolidated as what is available for the characterisation of surface texture and see the convergence of mathematical models, methods and algorithmic solutions coming from heterogeneous disciplines such as image processing, computer vision, coordinate metrology, reverse engineering, and computer-aided design. In this chapter an overview of the tools available in current surface metrology software is provided first. Then, the main challenges and open issues of achieving full metrological characterisation of individual surface features are introduced and discussed, as well as the current research approaches addressing them.

UR - http://www.scopus.com/inward/record.url?scp=84929915252&partnerID=8YFLogxK

U2 - 10.1007/978-3-642-36458-7_8

DO - 10.1007/978-3-642-36458-7_8

M3 - Chapter

SN - 3642364578

SN - 9783642364570

SP - 179

EP - 216

BT - Characterisation of Areal Surface Texture

A2 - Leach, Richard

PB - Springer-Verlag Berlin Heidelberg

ER -

Senin N, Blunt L. Characterisation of individual areal features. In Leach R, editor, Characterisation of Areal Surface Texture. Springer-Verlag Berlin Heidelberg. 2013. p. 179-216 https://doi.org/10.1007/978-3-642-36458-7_8