Abstract
The effective transport of high current, positive ion beams at low energies in ion implanters requires the a high level of space charge compensation. The self-induced or forced introduction of electrons is known to result in the creation of a so-called beam plasma through which the beam propagates. Despite the ability of beams at energies above about 3-5 keV to create their own neutralising plasmas and the development of highly effective, plasma based neutralising systems for low energy beams, very little is known about the nature of beam plasmas and how their characteristics and capabilities depend on beam current, beam energy and beamline pressure. These issues have been addressed in a detailed scanning Langmuir probe study of the plasmas created in beams passing through the post-analysis section of a commercial, high current ion implanter. Combined with Faraday cup measurements of the rate of loss of beam current in the same region due to charge exchange and scattering collisions, the probe data have provided a valuable insight into the nature of the slow ion and electron production and loss processes. Two distinct electron energy distribution functions are observed with electron temperatures ≥ 25 V and around 1 eV. The fast electrons observed must be produced in their energetic state. By studying the properties of the beam plasma as a function of the beam and beamline parameters, information on the ways in which the plasma and the beam interact to reduce beam blow-up and retain a stable plasma has been obtained.
Original language | English |
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Title of host publication | Ion Impantation Technology |
Subtitle of host publication | 16th International Conference on Ion Implantation Technology, IIT 2006 |
Editors | Karen Kirkby, Russell Gwilliam, Andy Smith, David Chivers |
Publisher | American Institute of Physics Publising LLC |
Pages | 340-344 |
Number of pages | 5 |
Volume | 866 |
ISBN (Print) | 9780735403659 |
Publication status | Published - 28 Dec 2006 |
Externally published | Yes |
Event | 16th International Conference on Ion Implantation Technology - Marseille, France Duration: 11 Jun 2006 → 16 Nov 2006 Conference number: 16 https://www.amazon.co.uk/Ion-Impantation-Technology-International-Instrumentations/dp/0735403651 |
Conference
Conference | 16th International Conference on Ion Implantation Technology |
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Abbreviated title | IIT 2006 |
Country/Territory | France |
City | Marseille |
Period | 11/06/06 → 16/11/06 |
Internet address |