Abstract
Microlens array (MLA) is a type of structured freeform surfaces which are widely used in advanced optical products. Fast tool servo (FTS) machining provides an indispensible solution for machining MLA with superior surface quality than traditional fabrication process for MLA. However, there are a lot of challenges in the characterization of the surface defects in FTS machining of MLA. This paper presents a pattern recognition and analysis method (PRAM) for the characterization of surface defects in FTS machining of MLA. The PRAM makes use of the Gabor filters to extract the features from the MLA. These features are used to train a Support Vector Machine (SVM) classifier for defects detection and analysis. To verify the method, a series of experiments have been conducted and the results show that the PRAM produces good accuracy of defects detection using different features and different classifiers. The successful development of PRAM throws some light on further study of surface characterization of other types of structure freeform surfaces.
| Original language | English |
|---|---|
| Pages (from-to) | 1240-1249 |
| Number of pages | 10 |
| Journal | Measurement: Journal of the International Measurement Confederation |
| Volume | 43 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Nov 2010 |
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Characterization of Surface Defects in Fast Tool Servo Machining of Microlens Array Using a Pattern Recognition and Analysis Method. / Jiang, X. Q.; Cheung, C. F.; Hu, K.; Kong, L. B.
In: Measurement: Journal of the International Measurement Confederation, Vol. 43, No. 9, 11.2010, p. 1240-1249.Research output: Contribution to journal › Article
TY - JOUR
T1 - Characterization of Surface Defects in Fast Tool Servo Machining of Microlens Array Using a Pattern Recognition and Analysis Method
AU - Jiang, X. Q.
AU - Cheung, C. F.
AU - Hu, K.
AU - Kong, L. B.
PY - 2010/11
Y1 - 2010/11
N2 - Microlens array (MLA) is a type of structured freeform surfaces which are widely used in advanced optical products. Fast tool servo (FTS) machining provides an indispensible solution for machining MLA with superior surface quality than traditional fabrication process for MLA. However, there are a lot of challenges in the characterization of the surface defects in FTS machining of MLA. This paper presents a pattern recognition and analysis method (PRAM) for the characterization of surface defects in FTS machining of MLA. The PRAM makes use of the Gabor filters to extract the features from the MLA. These features are used to train a Support Vector Machine (SVM) classifier for defects detection and analysis. To verify the method, a series of experiments have been conducted and the results show that the PRAM produces good accuracy of defects detection using different features and different classifiers. The successful development of PRAM throws some light on further study of surface characterization of other types of structure freeform surfaces.
AB - Microlens array (MLA) is a type of structured freeform surfaces which are widely used in advanced optical products. Fast tool servo (FTS) machining provides an indispensible solution for machining MLA with superior surface quality than traditional fabrication process for MLA. However, there are a lot of challenges in the characterization of the surface defects in FTS machining of MLA. This paper presents a pattern recognition and analysis method (PRAM) for the characterization of surface defects in FTS machining of MLA. The PRAM makes use of the Gabor filters to extract the features from the MLA. These features are used to train a Support Vector Machine (SVM) classifier for defects detection and analysis. To verify the method, a series of experiments have been conducted and the results show that the PRAM produces good accuracy of defects detection using different features and different classifiers. The successful development of PRAM throws some light on further study of surface characterization of other types of structure freeform surfaces.
KW - Fast Tool Servo
KW - Freeform Optics
KW - Microlens Array
KW - Pattern Recognition
KW - Structured Freeform Surfaces
KW - Surface Characterization
KW - Surface Measurement
KW - Ultra-Precision Machining
UR - http://www.scopus.com/inward/record.url?scp=77956057857&partnerID=8YFLogxK
U2 - 10.1016/j.measurement.2010.06.003
DO - 10.1016/j.measurement.2010.06.003
M3 - Article
AN - SCOPUS:77956057857
VL - 43
SP - 1240
EP - 1249
JO - Measurement
JF - Measurement
SN - 1536-6367
IS - 9
ER -