Abstract
Surface texture is generally a significant technique requirement of high-tech products. Surface quality information can usually play an increasing role in achieving interoperability among existing products, create order in markets, simplify production and ensure safety. As the most authoritative standard organizations, ASME and ISO services are used throughout the world, their codes and standards influence global manufacturers and consumers. ASME B46.1 is one of many vital tools to promote surface measurement techniques, while ISO has a set standard system for surface measurement, analysis and evaluation. This paper compares, the ASME B46.1 (2002) standard (Surface texture: surface roughness, waviness, and lay) with ISO 3274 (1997) standard on methods of surface profiles filtering. It preformed the present research in order to show the latest developments of the ASME B46.1 (2002) in the regime of contact profiling techniques where the degree of measurement control is highly advanced, and a large range of other techniques that present valid and useful descriptions of surface texture. Also, this paper shows the differences of terms, definitions and surface texture parameters between ASME B46.1 (2002) and ISO 4287 (1998). The different evaluation results have been calculated based on above two standards for the same surface data. Obviously, it is necessary to consider the divergence above to develop China's standards (GB) on surface texture.
Original language | English |
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Title of host publication | Third International Symposium on Precision Mechanical Measurements |
Editors | Kuang-Chao Fan, Wei Gao, Xiaofen Yu, Wenhao Huang, Penghao Hu |
Publisher | SPIE |
Number of pages | 7 |
Volume | 6280 |
ISBN (Print) | 0819463515, 9780819463517 |
DOIs | |
Publication status | Published - 13 Oct 2006 |
Event | Third International Symposium on Precision Mechanical Measurements - Urumqi, China Duration: 2 Aug 2006 → 6 Aug 2006 Conference number: 3 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Publisher | SPIE |
Volume | 6280 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Third International Symposium on Precision Mechanical Measurements |
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Country/Territory | China |
City | Urumqi |
Period | 2/08/06 → 6/08/06 |