Comparison between ASME and ISO Standards on surface texture

Kai Hu, Xiangqian Jiang, Xiaojun Liu, Zhengao Xu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)


Surface texture is generally a significant technique requirement of high-tech products. Surface quality information can usually play an increasing role in achieving interoperability among existing products, create order in markets, simplify production and ensure safety. As the most authoritative standard organizations, ASME and ISO services are used throughout the world, their codes and standards influence global manufacturers and consumers. ASME B46.1 is one of many vital tools to promote surface measurement techniques, while ISO has a set standard system for surface measurement, analysis and evaluation. This paper compares, the ASME B46.1 (2002) standard (Surface texture: surface roughness, waviness, and lay) with ISO 3274 (1997) standard on methods of surface profiles filtering. It preformed the present research in order to show the latest developments of the ASME B46.1 (2002) in the regime of contact profiling techniques where the degree of measurement control is highly advanced, and a large range of other techniques that present valid and useful descriptions of surface texture. Also, this paper shows the differences of terms, definitions and surface texture parameters between ASME B46.1 (2002) and ISO 4287 (1998). The different evaluation results have been calculated based on above two standards for the same surface data. Obviously, it is necessary to consider the divergence above to develop China's standards (GB) on surface texture.

Original languageEnglish
Title of host publicationThird International Symposium on Precision Mechanical Measurements
EditorsKuang-Chao Fan, Wei Gao, Xiaofen Yu, Wenhao Huang, Penghao Hu
Number of pages7
ISBN (Print)0819463515, 9780819463517
Publication statusPublished - 13 Oct 2006
EventThird International Symposium on Precision Mechanical Measurements - Urumqi, China
Duration: 2 Aug 20066 Aug 2006
Conference number: 3

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceThird International Symposium on Precision Mechanical Measurements


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