Abstract
Surface texture parameters have been used in industry to characterise surfaces since the early twentieth century but, despite the maturity of the subject, instrument comparisons still show large spreads in results. A significant contribution to these spreads is the effect of the software used to calculate the surface texture parameters. This paper presents the results of a comparison of a number of commercial software packages used to calculate surface texture parameters (profile parameters). The inputs to the software packages were reference measurement datasets and the results were compared to those obtained from reference algorithms available on the websites of NPL, PTB, and NIST.
Original language | English |
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Title of host publication | Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2010 |
Editors | H. Spaan |
Publisher | euspen |
Pages | 87-90 |
Number of pages | 4 |
Volume | 1 |
ISBN (Electronic) | 9780955308284 |
Publication status | Published - 2010 |
Event | 10th International Conference of the European Society for Precision Engineering and Nanotechnology - Delft, Netherlands Duration: 31 May 2010 → 4 Jun 2010 Conference number: 10 |
Conference
Conference | 10th International Conference of the European Society for Precision Engineering and Nanotechnology |
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Abbreviated title | EUSPEN 2010 |
Country/Territory | Netherlands |
City | Delft |
Period | 31/05/10 → 4/06/10 |