TY - JOUR
T1 - Complex ridgelets for shift invariant characterization of surface topography with line singularities
AU - Ma, Jianwei
AU - Jiang, Xiangqian
AU - Scott, Paul
PY - 2005/9/19
Y1 - 2005/9/19
N2 - A complex ridgelet transform, which provides shift invariance and good performance for line singularities, is proposed to solve the problems with existing wavelet-based methods in surface metrology by taking a dual-tree complex wavelet transform on the projections of the finite Radon transform. Numerical experiments show the efficiency of this methodology in approximation, denoising, and characterization of engineering and bioengineering surfaces with straight scratches.
AB - A complex ridgelet transform, which provides shift invariance and good performance for line singularities, is proposed to solve the problems with existing wavelet-based methods in surface metrology by taking a dual-tree complex wavelet transform on the projections of the finite Radon transform. Numerical experiments show the efficiency of this methodology in approximation, denoising, and characterization of engineering and bioengineering surfaces with straight scratches.
KW - Line singularities
KW - Radon transform
KW - Ridgelets
KW - Shift invariance
KW - Surface characterization
UR - http://www.scopus.com/inward/record.url?scp=24044486559&partnerID=8YFLogxK
U2 - 10.1016/j.physleta.2005.06.091
DO - 10.1016/j.physleta.2005.06.091
M3 - Article
AN - SCOPUS:24044486559
VL - 344
SP - 423
EP - 431
JO - Physics Letters, Section A: General, Atomic and Solid State Physics
JF - Physics Letters, Section A: General, Atomic and Solid State Physics
SN - 0375-9601
IS - 6
ER -