Complex Ridgelets for the Extraction of Morphological Features on Engineering Surfaces

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work.

Original languageEnglish
Pages (from-to)246-249
Number of pages4
JournalJournal of Physics: Conference Series
Volume13
Issue number1
DOIs
Publication statusPublished - 2005

Fingerprint

bioengineering
Radon
linings
Invariance
radon
wavelet analysis
Wavelet transforms
invariance
projection
Mathematical transformations
engineering
methodology
shift
Experiments
Bioengineering

Cite this

@article{9cf4ea9c5e874ffcaaf1091dee1045ed,
title = "Complex Ridgelets for the Extraction of Morphological Features on Engineering Surfaces",
abstract = "In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work.",
author = "Wenhan Zeng and Xiangqian Jiang and Paul Scott",
year = "2005",
doi = "10.1088/1742-6596/13/1/057",
language = "English",
volume = "13",
pages = "246--249",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",

}

TY - JOUR

T1 - Complex Ridgelets for the Extraction of Morphological Features on Engineering Surfaces

AU - Zeng, Wenhan

AU - Jiang, Xiangqian

AU - Scott, Paul

PY - 2005

Y1 - 2005

N2 - In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work.

AB - In this paper, a complex ridgelets transform, which provides approximate shift invariance analysis of line singularities, is proposed to extract morphological features with linear or directional/objective property, by taking a Dual Tree Complex Wavelet Transform (DT-CWT) on the projections of the Finite Radon Transform (FRAT). The Numerical experiments show the remarkable potential of this methodology to analyse engineering and bioengineering surfaces with liner scratches in comparison to wavelet-based methods developed in our pervious work.

UR - http://www.scopus.com/inward/record.url?scp=24644477651&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/13/1/057

DO - 10.1088/1742-6596/13/1/057

M3 - Article

VL - 13

SP - 246

EP - 249

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

ER -