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Dive into the research topics of 'Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings'. Together they form a unique fingerprint.- Sort by
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J. Sharp, I. Castillo Muller, P. Mandal, A. Abbas, G. West, W. M. Rainforth, A. Ehiasarian, P. Hovsepian
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review