Cross-sectional transmission electron microscopy studies of boron ion implantation in hexagonal boron nitride: English

Emily Aradi, S. R. Naidoo, F Cummings, I. Motochi, Trevor E. Derry

Research output: Contribution to journalArticle

Abstract

We have reported on the implantation of boron ion into hexagonal boron nitride (h-BN) material to aid the nucleation of cubic boron nitride nanocrystals (nc-BN).Single crystal h-BN was implanted with boron ion at 150 keV at fluences of the order of 1015 and 1017 ions/cm2 at room temperature. High Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF-STEM) mapping showed a variation in image contrast in samples irradiated to a fluence of 1 × 1015 ions/cm2. As predicted by Stopping Range and Ions in Materials (SRIM) calculations, the implanted region with the highest damage density appeared to have a bright contrast in HAADF-STEM which represented the high density c-BN symmetry. High Resolution Transmission Electron Microscopy (HRTEM) and electron diffraction measurements showed regions with nc-BN for samples implanted with low fluences and amorphous BN after implantation with high fluences indicating a fluence-related phase transition in BN. Raman spectroscopy showed the emergence of longitudinal optical frequency mode associated with c-BN after implantation.
Original languageEnglish
Pages (from-to)168-173
Number of pages6
JournalDiamond and Related Materials
Volume92
Early online date21 Dec 2018
DOIs
Publication statusPublished - Feb 2019

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