TY - JOUR
T1 - Crystal-orientation-dependent nanoscale machining mechanisms in ultrasonic vibration-assisted scratching sapphire
AU - Zhang, Yuqiang
AU - Hu, Zhongwei
AU - Yu, Yiqing
AU - Xu, Xipeng
AU - Zeng, Wenhan
AU - Zhong, Wenbin
AU - Blunt, Liam
AU - Jiang, Jane
N1 - Publisher Copyright:
© 2025 Elsevier B.V.
PY - 2025/11/5
Y1 - 2025/11/5
N2 - Ultrasonic vibration-assisted grinding (UVAG) is a promising, low-damage, high-efficiency and environmentally friendly technique for machining sapphire, yet its atomistic mechanisms and orientation dependence remain poorly understood. In this work, we employ molecular dynamics (MD) simulations to compare ultrasonic vibration-assisted scratching (UVAS) with conventional scratching (CS) on the A/C/M/R-planes of sapphire. Applying ultrasonic vibration dramatically reduces the scratching force by redistributing the stress field and activating cyclic deformation mechanisms, with the force-reduction sequence A≈ M > C > R. Surface-topography analysis shows that chip pile-up modes depend on crystal orientation; ultrasonic vibration not only lowers the pile-up height but also makes it more uniform. Moreover, ultrasonic vibration mitigates subsurface damage by suppressing tangled dislocation networks on the A- and M-planes and by promoting the nucleation of dislocations and twinning on the C- and R-planes, with the C-plane experiencing the least damage. These results systematically clarify the coupled effects of ultrasonic vibration and sapphire anisotropy, providing valuable guidance for selecting crystal orientations and vibration parameters during ultra-precision grinding of electronic devices, such as sustainable clean-energy LEDs.
AB - Ultrasonic vibration-assisted grinding (UVAG) is a promising, low-damage, high-efficiency and environmentally friendly technique for machining sapphire, yet its atomistic mechanisms and orientation dependence remain poorly understood. In this work, we employ molecular dynamics (MD) simulations to compare ultrasonic vibration-assisted scratching (UVAS) with conventional scratching (CS) on the A/C/M/R-planes of sapphire. Applying ultrasonic vibration dramatically reduces the scratching force by redistributing the stress field and activating cyclic deformation mechanisms, with the force-reduction sequence A≈ M > C > R. Surface-topography analysis shows that chip pile-up modes depend on crystal orientation; ultrasonic vibration not only lowers the pile-up height but also makes it more uniform. Moreover, ultrasonic vibration mitigates subsurface damage by suppressing tangled dislocation networks on the A- and M-planes and by promoting the nucleation of dislocations and twinning on the C- and R-planes, with the C-plane experiencing the least damage. These results systematically clarify the coupled effects of ultrasonic vibration and sapphire anisotropy, providing valuable guidance for selecting crystal orientations and vibration parameters during ultra-precision grinding of electronic devices, such as sustainable clean-energy LEDs.
KW - Anisotropy
KW - Machining mechanism
KW - Molecular dynamics simulation
KW - Sapphire
KW - Ultrasonic vibration
UR - http://www.scopus.com/inward/record.url?scp=105020825427&partnerID=8YFLogxK
U2 - 10.1016/j.apsusc.2025.165069
DO - 10.1016/j.apsusc.2025.165069
M3 - Article
AN - SCOPUS:105020825427
SN - 0169-4332
VL - 719
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 165069
ER -