Abstract
Photoreflectance (PR) and differential surface photovoltage (DSPV) spectroscopies were employed to characterize optically Be and Si δ-doped GaAs/AlAs multiple quantum wells. The surface electric field strength was estimated from the Franz-Keldysh oscillations clearly visible in PR spectra. Line shape analysis of DSPV spectra allowed one to estimate interband excitonic transition energies and broadening parameters for a large number of QW-related subbands; reasonable agreement was found between experimental and calculated transition energies. The interface quality and the main factors responsible for exciton line broadening were evaluated from spectroscopic data. These MQW structures were also studied as selective THz sensors by spectral photocurrent measurements at low temperatures.
Original language | English |
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Title of host publication | Physics of Semiconductors - 28th International Conference on the Physics of Semiconductors, ICPS 2006, Part A and B |
Editors | Wolfgang Jantsch, Friedrich Schaffler |
Publisher | AIP Publishing |
Pages | 427-428 |
Number of pages | 2 |
Volume | 893 |
ISBN (Print) | 9780735403970 |
DOIs | |
Publication status | Published - 10 Apr 2007 |
Externally published | Yes |
Event | 28th International Conference on the Physics of Semiconductors - Vienna, Austria Duration: 24 Jul 2006 → 28 Jul 2006 Conference number: 28 |
Publication series
Name | AIP Conference Proceedings |
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Volume | 893 |
ISSN (Print) | 0094-243X |
ISSN (Electronic) | 1551-7616 |
Conference
Conference | 28th International Conference on the Physics of Semiconductors |
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Abbreviated title | ICPS 2006 |
Country/Territory | Austria |
City | Vienna |
Period | 24/07/06 → 28/07/06 |