Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The additive manufacturing (AM) technology possesses the potential to change the paradigm for manufacturing. To facilitate the successful uptake of AM technologies into a wider range of applications, AM needs metrological methods to measure, evaluate, validate techniques for both AM processes and AM parts. Two strategies are proposed for the optimisation of AM processes and the evaluation of the functional performance of AM products. A specific procedure is developed for the characterisation of AM layer surfaces with an aim to reflect the unique characterisation of AM process. For complex functional AM surfaces which need the employment of X-ray computed tomography (XCT) for their measurement, the surface characterisation techniques, including filtration, are extended so that they can cope with the complex surface shapes and the triangular mesh data.
LanguageEnglish
Title of host publicationProceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing
Pages124-128
Number of pages5
Publication statusPublished - 10 Oct 2017
EventJoint Special Interest Group Meeting between EUSPEN and ASPE Dimensional Accuracy and Surface Finish in Additive Manufacturing - Katholieke Universiteit Leuven, Leuven, Belgium
Duration: 10 Oct 201711 Oct 2017

Conference

ConferenceJoint Special Interest Group Meeting between EUSPEN and ASPE Dimensional Accuracy and Surface Finish in Additive Manufacturing
CountryBelgium
CityLeuven
Period10/10/1711/10/17

Fingerprint

3D printers
Tomography

Cite this

Lou, S., Zeng, W., Pagani, L., Abdul-Rahman, H., Jiang, X., & Scott, P. (2017). Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces. In Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing (pp. 124-128)
Lou, Shan ; Zeng, Wenhan ; Pagani, Luca ; Abdul-Rahman, Hussein ; Jiang, Xiangqian ; Scott, Paul. / Development of Surface Characterisation Toolbox for Additive Manufactured Components : from Planar Layer Surfaces to Complex Functional Surfaces. Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing. 2017. pp. 124-128
@inproceedings{f19c45d8be8b4845a61c3bd948747e52,
title = "Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces",
abstract = "The additive manufacturing (AM) technology possesses the potential to change the paradigm for manufacturing. To facilitate the successful uptake of AM technologies into a wider range of applications, AM needs metrological methods to measure, evaluate, validate techniques for both AM processes and AM parts. Two strategies are proposed for the optimisation of AM processes and the evaluation of the functional performance of AM products. A specific procedure is developed for the characterisation of AM layer surfaces with an aim to reflect the unique characterisation of AM process. For complex functional AM surfaces which need the employment of X-ray computed tomography (XCT) for their measurement, the surface characterisation techniques, including filtration, are extended so that they can cope with the complex surface shapes and the triangular mesh data.",
keywords = "Additive manufacturing, surface texture, surface characterisation, triangular mesh",
author = "Shan Lou and Wenhan Zeng and Luca Pagani and Hussein Abdul-Rahman and Xiangqian Jiang and Paul Scott",
year = "2017",
month = "10",
day = "10",
language = "English",
isbn = "9780995775114",
pages = "124--128",
booktitle = "Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing",

}

Lou, S, Zeng, W, Pagani, L, Abdul-Rahman, H, Jiang, X & Scott, P 2017, Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces. in Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing. pp. 124-128, Joint Special Interest Group Meeting between EUSPEN and ASPE Dimensional Accuracy and Surface Finish in Additive Manufacturing, Leuven, Belgium, 10/10/17.

Development of Surface Characterisation Toolbox for Additive Manufactured Components : from Planar Layer Surfaces to Complex Functional Surfaces. / Lou, Shan; Zeng, Wenhan; Pagani, Luca; Abdul-Rahman, Hussein; Jiang, Xiangqian; Scott, Paul.

Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing. 2017. p. 124-128.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Development of Surface Characterisation Toolbox for Additive Manufactured Components

T2 - from Planar Layer Surfaces to Complex Functional Surfaces

AU - Lou, Shan

AU - Zeng, Wenhan

AU - Pagani, Luca

AU - Abdul-Rahman, Hussein

AU - Jiang, Xiangqian

AU - Scott, Paul

PY - 2017/10/10

Y1 - 2017/10/10

N2 - The additive manufacturing (AM) technology possesses the potential to change the paradigm for manufacturing. To facilitate the successful uptake of AM technologies into a wider range of applications, AM needs metrological methods to measure, evaluate, validate techniques for both AM processes and AM parts. Two strategies are proposed for the optimisation of AM processes and the evaluation of the functional performance of AM products. A specific procedure is developed for the characterisation of AM layer surfaces with an aim to reflect the unique characterisation of AM process. For complex functional AM surfaces which need the employment of X-ray computed tomography (XCT) for their measurement, the surface characterisation techniques, including filtration, are extended so that they can cope with the complex surface shapes and the triangular mesh data.

AB - The additive manufacturing (AM) technology possesses the potential to change the paradigm for manufacturing. To facilitate the successful uptake of AM technologies into a wider range of applications, AM needs metrological methods to measure, evaluate, validate techniques for both AM processes and AM parts. Two strategies are proposed for the optimisation of AM processes and the evaluation of the functional performance of AM products. A specific procedure is developed for the characterisation of AM layer surfaces with an aim to reflect the unique characterisation of AM process. For complex functional AM surfaces which need the employment of X-ray computed tomography (XCT) for their measurement, the surface characterisation techniques, including filtration, are extended so that they can cope with the complex surface shapes and the triangular mesh data.

KW - Additive manufacturing

KW - surface texture

KW - surface characterisation

KW - triangular mesh

UR - https://www.tib.eu/en/search/id/TIBKAT%3A100334609X/Proceedings-of-the-Special-Interest-Group-Meeting/

M3 - Conference contribution

SN - 9780995775114

SP - 124

EP - 128

BT - Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing

ER -

Lou S, Zeng W, Pagani L, Abdul-Rahman H, Jiang X, Scott P. Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces. In Proceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing. 2017. p. 124-128