Development of Surface Characterisation Toolbox for Additive Manufactured Components: from Planar Layer Surfaces to Complex Functional Surfaces

Shan Lou, Wenhan Zeng, Luca Pagani, Hussein Abdul-Rahman, Xiangqian Jiang, Paul Scott

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The additive manufacturing (AM) technology possesses the potential to change the paradigm for manufacturing. To facilitate the successful uptake of AM technologies into a wider range of applications, AM needs metrological methods to measure, evaluate, validate techniques for both AM processes and AM parts. Two strategies are proposed for the optimisation of AM processes and the evaluation of the functional performance of AM products. A specific procedure is developed for the characterisation of AM layer surfaces with an aim to reflect the unique characterisation of AM process. For complex functional AM surfaces which need the employment of X-ray computed tomography (XCT) for their measurement, the surface characterisation techniques, including filtration, are extended so that they can cope with the complex surface shapes and the triangular mesh data.
Original languageEnglish
Title of host publicationProceedings of the Special Interest Group meeting on Dimensional Accuracy and Surface Finish in Additive Manufacturing
Pages124-128
Number of pages5
Publication statusPublished - 10 Oct 2017
EventEuropean Society Precision Engineering and Special Interest Group: Additive Manufacturing - Katholieke Universiteit Leuven, Leuven, Belgium
Duration: 10 Oct 201711 Oct 2017
http://www.euspen.eu/events/special-interest-group-meeting-additive-manufacturing-10th-12th-october-2017/ (Link to Event Details )

Conference

ConferenceEuropean Society Precision Engineering and Special Interest Group
Country/TerritoryBelgium
CityLeuven
Period10/10/1711/10/17
Internet address

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