Development of the basis for in process metrology for roll to roll production of flexible photo voltaics

Liam Blunt, Mohamed Elrawemi, Leigh Fleming, Haydn Martin, Hussam Muhamedsalih, David Robbins

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports on the recent work carried out as part of the EU funded NanoMend project. The project seeks to develop integrated process inspection, cleaning, repair and control systems for thin films on flexible PV film based on CIGS (Copper Indium Gallium Selenide CuInxGa(1-x)Se 2). These films are fabricated on polymer film by the repeated deposition, and patterning, of thin layer materials using roll-to-roll processes, where the whole film is approximately 3um thick prior to final encapsulation. Current wide scale implementation however is hampered by long-term degradation of efficiency due to water ingress through the barrier layer defects to the CIGS modules causing electrical shorts and efficiency drops. A thin (∼40nm) barrier coating of Al2O3 usually provides the environmental protection for the PV cells. The highly conformal aluminium oxide barrier layer is produced by atomic layer deposition (ALD). The paper reports initial measurement taken on prototype films and reports on the correlation of water vapour transmission with defect density, it also reports on a new in process, high speed, environmentally robust optical interferometer instrument developed to detect defects on the polymer film during manufacture. These results provide the basis for the development of R2R in process metrology devices.

Original languageEnglish
Title of host publication11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014
PublisherIMEKO-International Measurement Federation Secretariat
Pages9-12
Number of pages4
ISBN (Print)9781632667311
Publication statusPublished - 2014
Event11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry - Tsukuba, Japan
Duration: 3 Sep 20145 Sep 2014

Conference

Conference11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry
Abbreviated titleLMPMI IMEKO TC14
CountryJapan
CityTsukuba
Period3/09/145/09/14

Fingerprint

Polymer films
Defects
Atomic layer deposition
Defect density
Gallium
Environmental protection
Encapsulation
Interferometers
Indium
Water vapor
Cleaning
Repair
Inspection
Copper
Aluminum
Control systems
Degradation
Thin films
Coatings
Oxides

Cite this

Blunt, L., Elrawemi, M., Fleming, L., Martin, H., Muhamedsalih, H., & Robbins, D. (2014). Development of the basis for in process metrology for roll to roll production of flexible photo voltaics. In 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014 (pp. 9-12). IMEKO-International Measurement Federation Secretariat.
Blunt, Liam ; Elrawemi, Mohamed ; Fleming, Leigh ; Martin, Haydn ; Muhamedsalih, Hussam ; Robbins, David. / Development of the basis for in process metrology for roll to roll production of flexible photo voltaics. 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014. IMEKO-International Measurement Federation Secretariat, 2014. pp. 9-12
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Blunt, L, Elrawemi, M, Fleming, L, Martin, H, Muhamedsalih, H & Robbins, D 2014, Development of the basis for in process metrology for roll to roll production of flexible photo voltaics. in 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014. IMEKO-International Measurement Federation Secretariat, pp. 9-12, 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, Tsukuba, Japan, 3/09/14.

Development of the basis for in process metrology for roll to roll production of flexible photo voltaics. / Blunt, Liam; Elrawemi, Mohamed; Fleming, Leigh; Martin, Haydn; Muhamedsalih, Hussam; Robbins, David.

11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014. IMEKO-International Measurement Federation Secretariat, 2014. p. 9-12.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AB - This paper reports on the recent work carried out as part of the EU funded NanoMend project. The project seeks to develop integrated process inspection, cleaning, repair and control systems for thin films on flexible PV film based on CIGS (Copper Indium Gallium Selenide CuInxGa(1-x)Se 2). These films are fabricated on polymer film by the repeated deposition, and patterning, of thin layer materials using roll-to-roll processes, where the whole film is approximately 3um thick prior to final encapsulation. Current wide scale implementation however is hampered by long-term degradation of efficiency due to water ingress through the barrier layer defects to the CIGS modules causing electrical shorts and efficiency drops. A thin (∼40nm) barrier coating of Al2O3 usually provides the environmental protection for the PV cells. The highly conformal aluminium oxide barrier layer is produced by atomic layer deposition (ALD). The paper reports initial measurement taken on prototype films and reports on the correlation of water vapour transmission with defect density, it also reports on a new in process, high speed, environmentally robust optical interferometer instrument developed to detect defects on the polymer film during manufacture. These results provide the basis for the development of R2R in process metrology devices.

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PB - IMEKO-International Measurement Federation Secretariat

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Blunt L, Elrawemi M, Fleming L, Martin H, Muhamedsalih H, Robbins D. Development of the basis for in process metrology for roll to roll production of flexible photo voltaics. In 11th IMEKO TC14 Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, LMPMI 2014. IMEKO-International Measurement Federation Secretariat. 2014. p. 9-12