Double slit interferometry to measure the EUV refractive indices of solids using high harmonics

Lucy A. Wilson, Andrew K. Rossall, Erik Wagenaars, Cephise M. Cacho, Emma Springate, I. C.Edmond Turcu, Greg J. Tallents

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Accurate values of the extreme ultraviolet (EUV) optical properties of materials are required to make EUV optics such as filters and multilayer mirrors. The optical properties of aluminum studied in this report are required, in particular, as aluminum is used as an EUV filter material. The complex refractive index of solid aluminum and the imaginary part of the refractive index of solid iron between 17 eV and 39 eV have been measured using EUV harmonics produced from an 800 nm laser focused to 1014 Wcm 2 in an argon gas jet impinging on a double slit interferometer.

LanguageEnglish
Pages2057-2061
Number of pages5
JournalApplied Optics
Volume51
Issue number12
DOIs
Publication statusPublished - 20 Apr 2012
Externally publishedYes

Fingerprint

Interferometry
slits
Refractive index
interferometry
refractivity
aluminum
Aluminum
harmonics
ultraviolet filters
Optical properties
optical properties
gas jets
Interferometers
Argon
Optics
Multilayers
interferometers
argon
optics
mirrors

Cite this

Wilson, L. A., Rossall, A. K., Wagenaars, E., Cacho, C. M., Springate, E., Turcu, I. C. E., & Tallents, G. J. (2012). Double slit interferometry to measure the EUV refractive indices of solids using high harmonics. Applied Optics, 51(12), 2057-2061. https://doi.org/10.1364/AO.51.002057
Wilson, Lucy A. ; Rossall, Andrew K. ; Wagenaars, Erik ; Cacho, Cephise M. ; Springate, Emma ; Turcu, I. C.Edmond ; Tallents, Greg J. / Double slit interferometry to measure the EUV refractive indices of solids using high harmonics. In: Applied Optics. 2012 ; Vol. 51, No. 12. pp. 2057-2061.
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Wilson, LA, Rossall, AK, Wagenaars, E, Cacho, CM, Springate, E, Turcu, ICE & Tallents, GJ 2012, 'Double slit interferometry to measure the EUV refractive indices of solids using high harmonics', Applied Optics, vol. 51, no. 12, pp. 2057-2061. https://doi.org/10.1364/AO.51.002057

Double slit interferometry to measure the EUV refractive indices of solids using high harmonics. / Wilson, Lucy A.; Rossall, Andrew K.; Wagenaars, Erik; Cacho, Cephise M.; Springate, Emma; Turcu, I. C.Edmond; Tallents, Greg J.

In: Applied Optics, Vol. 51, No. 12, 20.04.2012, p. 2057-2061.

Research output: Contribution to journalArticle

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