Errors and uncertainty in the topography gained via frequency-domain analysis

Andrew Henning, Claudiu Giusca

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Frequency Domain Analysis of measurement results from coherence scanning interferometers provides an estimate of the topography of the surface scattering the light, with claims of nm levels of accuracy being achieved. In the following work we use simulations of the measurement result to show that the limited set of spatial frequencies passed by the instrument can lead to errors in excess of 200 nm for surfaces with curvature. In addition we present a method that takes the uncertainty in the amplitude and phase of each element of the transfer function and provides the upper and lower limit on the location of the surface provided by the Frequency Domain Analysis method. This provides an idea of the level of accuracy that the spatial frequency components must be known to in order to reproduce curved surfaces well.
LanguageEnglish
Article number246211
Pages24057-24070
Number of pages14
JournalOptics Express
Volume23
Issue number18
DOIs
Publication statusPublished - 4 Sep 2015
Externally publishedYes

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frequency domain analysis
topography
curved surfaces
transfer functions
interferometers
curvature
scanning
estimates
scattering
simulation

Cite this

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Errors and uncertainty in the topography gained via frequency-domain analysis. / Henning, Andrew; Giusca, Claudiu.

In: Optics Express, Vol. 23, No. 18, 246211, 04.09.2015, p. 24057-24070.

Research output: Contribution to journalArticle

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AU - Giusca, Claudiu

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