Estimation of the Measurement Uncertainty based on Quasi Monte-Carlo Method in Optical Measurement

Hui Jing, Mei Fa Huang, Yan Ru Zhong, Bing Kuang, Xiang Qian Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Because measurement uncertainty is an important parameter to evaluate the reliability of measurement results, it is essential to present reliable methods to evaluate the measurement uncertainty especially in precise optical measurement. Though Monte-Carlo (MC) method has been applied to estimate the measurement uncertainty in recent years, this method, however, has some shortcomings such as low convergence and unstable results. Therefore its' application is limited. To evaluate the measurement uncertainty in a fast and robust way, Quasi Monte-Carlo (QMC) method is adopted in this paper. In the estimating process, more homogeneous random numbers (quasi random numbers) are generated based on Halton's sequence, and then these random numbers are transformed into the desired distribution random numbers. An experiment of cylinder measurement is given. The results show that the Quasi Monte-Carlo method has higher convergence rate and more stable evaluation results than that of Monte-Carlo method. Therefore, the quasi Monte-Carlo method can be applied efficiently to evaluate the measurement uncertainty.

Original languageEnglish
Title of host publicationInternational Symposium on Photoelectronic Detection and Imaging 2007
Subtitle of host publicationOptoelectronic System Design, Manufacturing, and Testing
EditorsLiwei Zhou
Place of PublicationWashington
PublisherSPIE
Number of pages10
Volume6624
ISBN (Print)9780819467669
DOIs
Publication statusPublished - 12 Mar 2008
Externally publishedYes
EventInternational Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China
Duration: 9 Sep 200712 Sep 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume6624
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Symposium on Photoelectronic Detection and Imaging
Abbreviated titleISPDI 2007
Country/TerritoryChina
CityBeijing
Period9/09/0712/09/07

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