Extending the vertical range of wavelength scanning interferometry

Giuseppe Moschetti, Hussam Muhamedsalih, Xiangqian Jiang, Richard K. Leach, Daniel O'Connor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LanguageEnglish
Title of host publicationProceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology
PublisherAmerican Society for Precision Engineering, ASPE
Pages50-55
Number of pages6
ISBN (Electronic)9781887706681
Publication statusPublished - 2015
Event5th ASPE Topical Meeting on Precision Interferometric Metrology - The Golden Hotel, Golden, United States
Duration: 8 Jul 201510 Jul 2015
https://www.osa.org/en-us/meetings/global_calendar/events/2015/5th_aspe_topical_meeting_on_precision_interferomet/ (Link to Conference Website )

Conference

Conference5th ASPE Topical Meeting on Precision Interferometric Metrology
CountryUnited States
CityGolden
Period8/07/1510/07/15
Internet address

Cite this

Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. K., & O'Connor, D. (2015). Extending the vertical range of wavelength scanning interferometry. In Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology (pp. 50-55). American Society for Precision Engineering, ASPE.
Moschetti, Giuseppe ; Muhamedsalih, Hussam ; Jiang, Xiangqian ; Leach, Richard K. ; O'Connor, Daniel. / Extending the vertical range of wavelength scanning interferometry. Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, 2015. pp. 50-55
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title = "Extending the vertical range of wavelength scanning interferometry",
author = "Giuseppe Moschetti and Hussam Muhamedsalih and Xiangqian Jiang and Leach, {Richard K.} and Daniel O'Connor",
year = "2015",
language = "English",
pages = "50--55",
booktitle = "Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology",
publisher = "American Society for Precision Engineering, ASPE",

}

Moschetti, G, Muhamedsalih, H, Jiang, X, Leach, RK & O'Connor, D 2015, Extending the vertical range of wavelength scanning interferometry. in Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, pp. 50-55, 5th ASPE Topical Meeting on Precision Interferometric Metrology, Golden, United States, 8/07/15.

Extending the vertical range of wavelength scanning interferometry. / Moschetti, Giuseppe; Muhamedsalih, Hussam; Jiang, Xiangqian; Leach, Richard K.; O'Connor, Daniel.

Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, 2015. p. 50-55.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Extending the vertical range of wavelength scanning interferometry

AU - Moschetti, Giuseppe

AU - Muhamedsalih, Hussam

AU - Jiang, Xiangqian

AU - Leach, Richard K.

AU - O'Connor, Daniel

PY - 2015

Y1 - 2015

UR - http://www.scopus.com/inward/record.url?scp=84940642411&partnerID=8YFLogxK

M3 - Conference contribution

SP - 50

EP - 55

BT - Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology

PB - American Society for Precision Engineering, ASPE

ER -

Moschetti G, Muhamedsalih H, Jiang X, Leach RK, O'Connor D. Extending the vertical range of wavelength scanning interferometry. In Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE. 2015. p. 50-55