| Original language | English |
|---|---|
| Title of host publication | Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology |
| Publisher | American Society for Precision Engineering, ASPE |
| Pages | 50-55 |
| Number of pages | 6 |
| ISBN (Electronic) | 9781887706681 |
| Publication status | Published - 2015 |
| Event | 5th ASPE Topical Meeting on Precision Interferometric Metrology - The Golden Hotel, Golden, United States Duration: 8 Jul 2015 → 10 Jul 2015 https://www.osa.org/en-us/meetings/global_calendar/events/2015/5th_aspe_topical_meeting_on_precision_interferomet/ (Link to Conference Website ) |
Conference
| Conference | 5th ASPE Topical Meeting on Precision Interferometric Metrology |
|---|---|
| Country | United States |
| City | Golden |
| Period | 8/07/15 → 10/07/15 |
| Internet address |
|
Cite this
Moschetti, G., Muhamedsalih, H., Jiang, X., Leach, R. K., & O'Connor, D. (2015). Extending the vertical range of wavelength scanning interferometry. In Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology (pp. 50-55). American Society for Precision Engineering, ASPE.
@inproceedings{5a71076896f7465e8e45a5c7e8f5b77a,
title = "Extending the vertical range of wavelength scanning interferometry",
author = "Giuseppe Moschetti and Hussam Muhamedsalih and Xiangqian Jiang and Leach, {Richard K.} and Daniel O'Connor",
year = "2015",
language = "English",
pages = "50--55",
booktitle = "Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology",
publisher = "American Society for Precision Engineering, ASPE",
}
Moschetti, G, Muhamedsalih, H, Jiang, X, Leach, RK & O'Connor, D 2015, Extending the vertical range of wavelength scanning interferometry. in Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, pp. 50-55, 5th ASPE Topical Meeting on Precision Interferometric Metrology, Golden, United States, 8/07/15.
Extending the vertical range of wavelength scanning interferometry. / Moschetti, Giuseppe; Muhamedsalih, Hussam; Jiang, Xiangqian; Leach, Richard K.; O'Connor, Daniel.
Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE, 2015. p. 50-55.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Extending the vertical range of wavelength scanning interferometry
AU - Moschetti, Giuseppe
AU - Muhamedsalih, Hussam
AU - Jiang, Xiangqian
AU - Leach, Richard K.
AU - O'Connor, Daniel
PY - 2015
Y1 - 2015
UR - http://www.scopus.com/inward/record.url?scp=84940642411&partnerID=8YFLogxK
M3 - Conference contribution
SP - 50
EP - 55
BT - Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology
PB - American Society for Precision Engineering, ASPE
ER -
Moschetti G, Muhamedsalih H, Jiang X, Leach RK, O'Connor D. Extending the vertical range of wavelength scanning interferometry. In Proceedings - ASPE 2015 Summer Topical Meeting: Precision Interferometric Metrology. American Society for Precision Engineering, ASPE. 2015. p. 50-55