Abstract
We demonstrate that interferometric probing with extreme ultraviolet (EUV) laser light enables determination of the degree of ionization of the "warm dense matter" produced between the critical and ablation surfaces of laser plasmas. Interferometry has been utilized to measure both transmission and phase information for an EUV laser beam at the photon energy of 58.5 eV, probing longitudinally through laser-irradiated plastic (parylene-N) targets (thickness 350 nm) irradiated by a 300 ps duration pulse of wavelength 438 nm and peak irradiance 1012 W cm-2. The transmission of the EUV probe beam provides a measure of the rate of target ablation, as ablated plasma becomes close to transparent when the photon energy is less than the ionization energy of the predominant ion species. We show that refractive indices η below the solid parylene N (ηsolid = 0.946) and expected plasma values are produced in the warm dense plasma created by laser irradiation due to bound-free absorption in C+.
| Language | English |
|---|---|
| Pages | 3820-3822 |
| Number of pages | 3 |
| Journal | Optics Letters |
| Volume | 35 |
| Issue number | 22 |
| DOIs | |
| Publication status | Published - 9 Nov 2010 |
| Externally published | Yes |
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Extreme ultraviolet interferometry of warm dense matter in laser plasmas. / Gartside, L. M.R.; Tallents, G. J.; Rossall, A. K.; Wagenaars, E.; Whittaker, D. S.; Kozlova, M.; Nejdl, J.; Sawicka, M.; Polan, J.; Kalal, M.; Rus, B.
In: Optics Letters, Vol. 35, No. 22, 09.11.2010, p. 3820-3822.Research output: Contribution to journal › Article
TY - JOUR
T1 - Extreme ultraviolet interferometry of warm dense matter in laser plasmas
AU - Gartside, L. M.R.
AU - Tallents, G. J.
AU - Rossall, A. K.
AU - Wagenaars, E.
AU - Whittaker, D. S.
AU - Kozlova, M.
AU - Nejdl, J.
AU - Sawicka, M.
AU - Polan, J.
AU - Kalal, M.
AU - Rus, B.
PY - 2010/11/9
Y1 - 2010/11/9
N2 - We demonstrate that interferometric probing with extreme ultraviolet (EUV) laser light enables determination of the degree of ionization of the "warm dense matter" produced between the critical and ablation surfaces of laser plasmas. Interferometry has been utilized to measure both transmission and phase information for an EUV laser beam at the photon energy of 58.5 eV, probing longitudinally through laser-irradiated plastic (parylene-N) targets (thickness 350 nm) irradiated by a 300 ps duration pulse of wavelength 438 nm and peak irradiance 1012 W cm-2. The transmission of the EUV probe beam provides a measure of the rate of target ablation, as ablated plasma becomes close to transparent when the photon energy is less than the ionization energy of the predominant ion species. We show that refractive indices η below the solid parylene N (ηsolid = 0.946) and expected plasma values are produced in the warm dense plasma created by laser irradiation due to bound-free absorption in C+.
AB - We demonstrate that interferometric probing with extreme ultraviolet (EUV) laser light enables determination of the degree of ionization of the "warm dense matter" produced between the critical and ablation surfaces of laser plasmas. Interferometry has been utilized to measure both transmission and phase information for an EUV laser beam at the photon energy of 58.5 eV, probing longitudinally through laser-irradiated plastic (parylene-N) targets (thickness 350 nm) irradiated by a 300 ps duration pulse of wavelength 438 nm and peak irradiance 1012 W cm-2. The transmission of the EUV probe beam provides a measure of the rate of target ablation, as ablated plasma becomes close to transparent when the photon energy is less than the ionization energy of the predominant ion species. We show that refractive indices η below the solid parylene N (ηsolid = 0.946) and expected plasma values are produced in the warm dense plasma created by laser irradiation due to bound-free absorption in C+.
UR - http://www.scopus.com/inward/record.url?scp=78549258141&partnerID=8YFLogxK
U2 - 10.1364/OL.35.003820
DO - 10.1364/OL.35.003820
M3 - Article
VL - 35
SP - 3820
EP - 3822
JO - Optics Letters
T2 - Optics Letters
JF - Optics Letters
SN - 0146-9592
IS - 22
ER -