Fast atom bombardment mass spectrometry for applied surface analysis

D. J. Surman; J. A. van den Berg; J. C. Vickerman

doi:10.1002/sia.740040407

Fast atom bombardment mass spectrometry for applied surface analysis

D. J. Surman, J. A. van den Berg, J. C. Vickerman

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Abstract

Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.

Original language	English
Pages (from-to)	160-167
Number of pages	8
Journal	Surface and Interface Analysis
Volume	4
Issue number	4
DOIs	https://doi.org/10.1002/sia.740040407
Publication status	Published - Aug 1982
Externally published	Yes

Access to Document

10.1002/sia.740040407

Cite this

@article{54e1fcc4d9cf46d2b789a17aefdac314,

title = "Fast atom bombardment mass spectrometry for applied surface analysis",

abstract = "Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.",

author = "Surman, {D. J.} and {van den Berg}, {J. A.} and Vickerman, {J. C.}",

year = "1982",

month = aug,

doi = "10.1002/sia.740040407",

language = "English",

volume = "4",

pages = "160--167",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

number = "4",

}

TY - JOUR

T1 - Fast atom bombardment mass spectrometry for applied surface analysis

AU - Surman, D. J.

AU - van den Berg, J. A.

AU - Vickerman, J. C.

PY - 1982/8

Y1 - 1982/8

N2 - Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.

AB - Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.

UR - http://www.scopus.com/inward/record.url?scp=0020172567&partnerID=8YFLogxK

U2 - 10.1002/sia.740040407

DO - 10.1002/sia.740040407

M3 - Article

AN - SCOPUS:0020172567

VL - 4

SP - 160

EP - 167

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 4

ER -

Fast atom bombardment mass spectrometry for applied surface analysis

Abstract

Access to Document

Other files and links

Fingerprint

Cite this