Fast atom bombardment mass spectrometry for applied surface analysis

D. J. Surman, J. A. van den Berg, J. C. Vickerman

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.

Original languageEnglish
Pages (from-to)160-167
Number of pages8
JournalSurface and Interface Analysis
Volume4
Issue number4
DOIs
Publication statusPublished - Aug 1982
Externally publishedYes

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