Fast atom bombardment mass spectrometry for applied surface analysis

D. J. Surman, J. A. van den Berg, J. C. Vickerman

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

Fast atom bombardment mass spectrometry permits the detection of secondary ions from surfaces of insulator materials without the necessity for charge neutralization of the surface by electron bombardment. It thus opens the possibility of routine mass spectral analysis of surfaces yielding data concerning not only their elemental composition but also their chemical structure. The possibilities are illustrated from examples of the analysis of glass and catalyst surfaces.

LanguageEnglish
Pages160-167
Number of pages8
JournalSurface and Interface Analysis
Volume4
Issue number4
DOIs
Publication statusPublished - Aug 1982
Externally publishedYes

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Surface analysis
Mass spectrometry
bombardment
mass spectroscopy
Atoms
atoms
electron bombardment
Spectrum analysis
spectrum analysis
insulators
Ions
catalysts
Glass
Catalysts
Electrons
glass
Chemical analysis
ions

Cite this

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Fast atom bombardment mass spectrometry for applied surface analysis. / Surman, D. J.; van den Berg, J. A.; Vickerman, J. C.

In: Surface and Interface Analysis, Vol. 4, No. 4, 08.1982, p. 160-167.

Research output: Contribution to journalArticle

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