Fundaments of measurement for computationally-intensive metrology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


Results are presented from a project between European national laboratories (EUROMET), entitled “Traceability for Computationally-Intensive Metrology” (JRP NEW06 (TraCIM)) to demonstrate metrology software is fit for purpose. The paper begins by presenting a new mathematical model for measurement, based on “measurement as an inverse problem” that has consequences for reconstruction algorithms in many modern complex measuring instruments such as CT scanners and white light interferometers. Since metrology software is part of the measuring procedure the “measurement as an inverse problem” model applies and can be used as a foundation to derive properties and build tests for metrology software
Original languageEnglish
Title of host publicationAdvanced Mathematical and Computational Tools in Metrology and Testing XI
EditorsA Forbes, N Zhang, A Chunovkina, S Eichstadt, F Pavese
PublisherWorld Scientific Publishing Co. Pte Ltd
Number of pages9
ISBN (Electronic)9789813274310
ISBN (Print)9789813274297
Publication statusPublished - 1 Dec 2018
EventAdvanced Mathematical and Computational Tools in Metrology and Testing XI - University of Strathclyde, Glasgow, United Kingdom
Duration: 29 Aug 201731 Aug 2017
Conference number: XI (Link to Call for Papers)

Publication series

NameSeries on Advances in Mathematics for Applied Sciences
PublisherWorld Scientific
ISSN (Print)1793-0901


ConferenceAdvanced Mathematical and Computational Tools in Metrology and Testing XI
Country/TerritoryUnited Kingdom
Internet address


Dive into the research topics of 'Fundaments of measurement for computationally-intensive metrology'. Together they form a unique fingerprint.

Cite this