Abstract
Focus variation microscopy (FVM) and X-ray computed tomography (XCT) are two popular technologies employed to measure the surface texture of additively manufactured components. The impacts of various influence factors of these two measurement techniques on surface texture measurement are investigated, respectively. A twostage surface registration program is developed to allow the accurate comparison of surface topographies measured by two instruments at the same location on the surface. The associated surface texture parameters Sa, Sq, Ssk, and Sku are also compared. The results indicate XCT can capture reentrant features, while FVM can capture more details. However, XCT measurement is limited in its resolution and FVM measurement is restricted by the line-of-sight constraint. The surface parameters of two measurement techniques are closer in the cases where surface texture of the parts is higher
Original language | English |
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Title of host publication | Proceedings of the 26th International Conference on Automation & Computing |
Editors | Chenguang Yang |
Publisher | IEEE |
Number of pages | 6 |
ISBN (Electronic) | 9781860435577 |
ISBN (Print) | 9781665443524 |
DOIs | |
Publication status | Published - 15 Nov 2021 |
Event | 26th International Conference on Automation and Computing - University of Portsmouth, Portsmouth, United Kingdom Duration: 2 Sep 2021 → 4 Sep 2021 Conference number: 26 http://www.cacsuk.co.uk/index.php/icac2021 https://www.ieee-ras.org/conferences-workshops/technically-co-sponsored/icac https://ieeexplore.ieee.org/xpl/conhome/9594055/proceeding |
Conference
Conference | 26th International Conference on Automation and Computing |
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Abbreviated title | ICAC 2021 |
Country/Territory | United Kingdom |
City | Portsmouth |
Period | 2/09/21 → 4/09/21 |
Internet address |