FVM and XCT Measurement of Surface Texture of Additively Manufactured Parts

Weidong Liu, Xiao Chen, Wenhan Zeng, Wenjuan Sun, Jane Jiang, Paul Scott, Shan Lou

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)


Focus variation microscopy (FVM) and X-ray computed tomography (XCT) are two popular technologies employed to measure the surface texture of additively manufactured components. The impacts of various influence factors of these two measurement techniques on surface texture measurement are investigated, respectively. A twostage surface registration program is developed to allow the accurate comparison of surface topographies measured by two instruments at the same location on the surface. The associated surface texture parameters Sa, Sq, Ssk, and Sku are also compared. The results indicate XCT can capture reentrant features, while FVM can capture more details. However, XCT measurement is limited in its resolution and FVM measurement is restricted by the line-of-sight constraint. The surface parameters of two measurement techniques are closer in the cases where surface texture of the parts is higher
Original languageEnglish
Title of host publicationProceedings of the 26th International Conference on Automation & Computing
EditorsChenguang Yang
Number of pages6
ISBN (Electronic)9781860435577
ISBN (Print)9781665443524
Publication statusPublished - 15 Nov 2021
Event26th International Conference on Automation and Computing - University of Portsmouth, Portsmouth, United Kingdom
Duration: 2 Sep 20214 Sep 2021
Conference number: 26


Conference26th International Conference on Automation and Computing
Abbreviated titleICAC 2021
Country/TerritoryUnited Kingdom
Internet address


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