Generalization of profile texture parameters for additively manufactured surfaces

L Pagani, F Zanini, S Carmignato, X Jiang, PJ Scott

Research output: Contribution to journalConference article

Abstract

Additive manufacturing technologies allow the production of highly complex parts. The surface topography of such parts often presents micro-scale and freeform-shaped re-entrant features. These features cannot be measured completely using optical or tactile techniques, without sectioning the sample. Therefore, X-ray computed tomography has recently started to be used for topographical measurement of additively manufactured surfaces, as it is capable
of acquiring also re-entrant features of the surface when a sufficiently high spatial resolution is achieved. However, profile texture parameters described in the standard ISO 4287 are not suited to characterise the aforementioned profiles, due to the possible re-entrant features. This paper proposes a new definition of texture parameters optimised for additively manufactured
surface profiles with the presence of re-entrant features, measured by means of X-ray computed tomography.
Original languageEnglish
Article number212019
Number of pages4
JournalJournal of Physics: Conference Series
Volume1065
Issue number21
DOIs
Publication statusPublished - 13 Nov 2018
EventInternational Measurement Confederation XXII World Congress: Knowledge Through Measurement - Belfast Waterfront, Belfast, Ireland
Duration: 3 Sep 20186 Sep 2018
Conference number: XXII
http://www.imeko2018.org/ (Link to Congress Website)

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