@inproceedings{6ef75c8761474506bee54b3b58c8cd40,
title = "Grating technology for topography measurement of curved surfaces",
abstract = "In this paper a new grating technology for topography measurement of the curved surface is described. It adopts a laser-grating interferometry sensing system whose standard depends on the RCHD grating constant. The optical principle and system characteristics are discussed in detail. The results of principle experiment are given. Key words: Topography measurement of curved surface laser-grating interferometry sensing system grating interferometry reflective cylindric holographic diffractive (RCHD) grating.",
keywords = "Holographic interferometry, Topography, Interferometry",
author = "Xiangqian Jiang and Xie, {Tie Bang} and Yao, {Cai Xian} and Zhu Li",
note = "Funding Information: The project supported by National Natural Science Foundation of China. Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Measurement Technology and Intelligent Instruments 1993 ; Conference date: 29-10-1993 Through 05-11-1993",
year = "1993",
month = sep,
day = "22",
doi = "10.1117/12.156502",
language = "English",
volume = "2101",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "554--557",
editor = "Li Zhu",
booktitle = "Measurement Technology and Intelligent Instruments",
address = "United States",
}