High-Resolution Three-Dimensional Imaging of Dislocations

J. S. Barnard, J. Sharp, J. R. Tong, P. A. Midgley

Research output: Contribution to journalComment/debatepeer-review

106 Citations (Scopus)

Abstract

Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.

Original languageEnglish
Pages (from-to)319
Number of pages1
JournalScience
Volume313
Issue number5785
DOIs
Publication statusPublished - 21 Jul 2006
Externally publishedYes

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