High-Resolution Three-Dimensional Imaging of Dislocations

J. S. Barnard; J. Sharp; J. R. Tong; P. A. Midgley

doi:10.1126/science.1125783

High-Resolution Three-Dimensional Imaging of Dislocations

J. S. Barnard, J. Sharp, J. R. Tong, P. A. Midgley

Research output: Contribution to journal › Comment/debate › peer-review

126 Citations (Scopus)

Abstract

Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.

Original language	English
Pages (from-to)	319
Number of pages	1
Journal	Science
Volume	313
Issue number	5785
DOIs	https://doi.org/10.1126/science.1125783
Publication status	Published - 21 Jul 2006
Externally published	Yes

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title = "High-Resolution Three-Dimensional Imaging of Dislocations",

abstract = "Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.",

keywords = "Electron microscopy, tomography",

author = "Barnard, {J. S.} and J. Sharp and Tong, {J. R.} and Midgley, {P. A.}",

year = "2006",

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AU - Barnard, J. S.

AU - Sharp, J.

AU - Tong, J. R.

AU - Midgley, P. A.

PY - 2006/7/21

Y1 - 2006/7/21

N2 - Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.

AB - Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.

KW - Electron microscopy

KW - tomography

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DO - 10.1126/science.1125783

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SP - 319

JO - Science

JF - Science

SN - 0036-8075

IS - 5785

ER -

High-Resolution Three-Dimensional Imaging of Dislocations

Abstract

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