Identifying and exploiting ultrametricity

Fionn Murtagh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

We begin with pervasive ultrametricity due to high dimensionality and/or spatial sparsity. How extent or degree of ultrametricity can be quantified leads us to the discussion of varied practical cases when ultrametricity can be partially or locally present in data. We show how the ultrametricity can be assessed in text or document collections, and in time series signals. In our presentation we also discussed applications to chemical information retrieval and to astrophysics, in particular observational cosmology.

Original languageEnglish
Title of host publicationAdvances in Data Analysis
Subtitle of host publicationProceedings of the 30th Annual Conference of the Gesellschaft für Klassifikation
EditorsReinhold Decker, Hans-J Lenz
PublisherSpringer Verlag
Pages263-272
Number of pages10
ISBN (Electronic)9783540709817
ISBN (Print)9783540709800
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
Event30th Annual Conference of the German Classification Society on Advances in Data Analysis - Berlin, Germany
Duration: 8 Mar 200610 Mar 2006
Conference number: 30

Conference

Conference30th Annual Conference of the German Classification Society on Advances in Data Analysis
Abbreviated titleGfKl 2006
CountryGermany
CityBerlin
Period8/03/0610/03/06

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  • Cite this

    Murtagh, F. (2007). Identifying and exploiting ultrametricity. In R. Decker, & H-J. Lenz (Eds.), Advances in Data Analysis: Proceedings of the 30th Annual Conference of the Gesellschaft für Klassifikation (pp. 263-272). Springer Verlag. https://doi.org/10.1007/978-3-540-70981-7_30