Implementation of line-scan dispersive interferometry for defect detection

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Surface assurance is one of the main concerns for advanced manufacturing technologies such as Roll- To-Roll (R2R) technique. The undesired defects present on the barrier films make R2R products suffer from a low efficiency and short life span. In order to enhance the performance and the yield of the products, an inspection system enabling in-line metrology of functional surfaces in production lines is desirable to optimise the manufacturing processes. This paper reports an instantaneous line-scan dispersive interferometry which has sufficient resolutions and nano-scale measurement repeatability to detect defects on flexible PV films. Free from any mechanical scanning and obtaining a surface profile in a single shot allows this setup to minimise environmental effects and to be used on the shop floor. The captured spectral interferogram is analysed using a FFT based algorithm, and the process time can be accelerated through data parallelism using a graphics processing unit (GPU). The performance of the developed system was evaluated experimentally by measuring the polyethylene naphthalate (PEN) films provided by the Centre for Process Innovation (CPI). The experimental details and results are presented in this paper.

Original languageEnglish
Title of host publicationProceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology
Subtitle of host publicationEUSPEN 2016
EditorsR. Leach
Publishereuspen
Number of pages2
ISBN (Electronic)9780956679086
Publication statusPublished - 2016
Event16th International Conference of the European Society for Precision Engineering and Nanotechnology - East Midlands Conference Centre, Nottingham, United Kingdom
Duration: 30 May 20163 Jun 2016
Conference number: 16
https://www.euspen.eu/events/16th-international-conference-exhibition/ (Link to Conference Website)

Conference

Conference16th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2016
CountryUnited Kingdom
CityNottingham
Period30/05/163/06/16
OtherThis event offers the possibility to see latest advances in traditional precision engineering fields such as metrology, ultra precision machining, additive and replication processes, precision mechatronic systems & control and precision cutting processes.
Internet address

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  • Cite this

    Tang, D., Gao, F., & Jiang, X. (2016). Implementation of line-scan dispersive interferometry for defect detection. In R. Leach (Ed.), Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016 euspen. http://eprints.hud.ac.uk/id/eprint/28713/