Implementation of line-scan dispersive interferometry for defect detection

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Surface assurance is one of the main concerns for advanced manufacturing technologies such as Roll- To-Roll (R2R) technique. The undesired defects present on the barrier films make R2R products suffer from a low efficiency and short life span. In order to enhance the performance and the yield of the products, an inspection system enabling in-line metrology of functional surfaces in production lines is desirable to optimise the manufacturing processes. This paper reports an instantaneous line-scan dispersive interferometry which has sufficient resolutions and nano-scale measurement repeatability to detect defects on flexible PV films. Free from any mechanical scanning and obtaining a surface profile in a single shot allows this setup to minimise environmental effects and to be used on the shop floor. The captured spectral interferogram is analysed using a FFT based algorithm, and the process time can be accelerated through data parallelism using a graphics processing unit (GPU). The performance of the developed system was evaluated experimentally by measuring the polyethylene naphthalate (PEN) films provided by the Centre for Process Innovation (CPI). The experimental details and results are presented in this paper.

LanguageEnglish
Title of host publicationProceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology
Subtitle of host publicationEUSPEN 2016
EditorsR. Leach
Publishereuspen
Number of pages2
ISBN (Electronic)9780956679086
Publication statusPublished - 2016
Event16th International Conference of the European Society for Precision Engineering and Nanotechnology - East Midlands Conference Centre, Nottingham, United Kingdom
Duration: 30 May 20163 Jun 2016
Conference number: 16
https://www.euspen.eu/events/16th-international-conference-exhibition/ (Link to Conference Website)

Conference

Conference16th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2016
CountryUnited Kingdom
CityNottingham
Period30/05/163/06/16
OtherThis event offers the possibility to see latest advances in traditional precision engineering fields such as metrology, ultra precision machining, additive and replication processes, precision mechatronic systems & control and precision cutting processes.
Internet address

Fingerprint

Interferometry
interferometry
defects
manufacturing
life span
Defects
fast Fourier transformations
assurance
Polyethylene
products
Fast Fourier transforms
metrology
shot
Environmental impact
Polyethylenes
polyethylenes
inspection
Innovation
Inspection
Scanning

Cite this

Tang, D., Gao, F., & Jiang, X. (2016). Implementation of line-scan dispersive interferometry for defect detection. In R. Leach (Ed.), Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016 euspen.
Tang, Dawei ; Gao, Feng ; Jiang, Xiangqian. / Implementation of line-scan dispersive interferometry for defect detection. Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016. editor / R. Leach. euspen, 2016.
@inproceedings{f5ca073fa55d4c558a5c0be865b824f2,
title = "Implementation of line-scan dispersive interferometry for defect detection",
abstract = "Surface assurance is one of the main concerns for advanced manufacturing technologies such as Roll- To-Roll (R2R) technique. The undesired defects present on the barrier films make R2R products suffer from a low efficiency and short life span. In order to enhance the performance and the yield of the products, an inspection system enabling in-line metrology of functional surfaces in production lines is desirable to optimise the manufacturing processes. This paper reports an instantaneous line-scan dispersive interferometry which has sufficient resolutions and nano-scale measurement repeatability to detect defects on flexible PV films. Free from any mechanical scanning and obtaining a surface profile in a single shot allows this setup to minimise environmental effects and to be used on the shop floor. The captured spectral interferogram is analysed using a FFT based algorithm, and the process time can be accelerated through data parallelism using a graphics processing unit (GPU). The performance of the developed system was evaluated experimentally by measuring the polyethylene naphthalate (PEN) films provided by the Centre for Process Innovation (CPI). The experimental details and results are presented in this paper.",
keywords = "Defect detection, Dispersive interferometry, Phase slope, Photovoltaic film",
author = "Dawei Tang and Feng Gao and Xiangqian Jiang",
year = "2016",
language = "English",
editor = "R. Leach",
booktitle = "Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology",
publisher = "euspen",

}

Tang, D, Gao, F & Jiang, X 2016, Implementation of line-scan dispersive interferometry for defect detection. in R Leach (ed.), Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016. euspen, 16th International Conference of the European Society for Precision Engineering and Nanotechnology, Nottingham, United Kingdom, 30/05/16.

Implementation of line-scan dispersive interferometry for defect detection. / Tang, Dawei; Gao, Feng; Jiang, Xiangqian.

Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016. ed. / R. Leach. euspen, 2016.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Implementation of line-scan dispersive interferometry for defect detection

AU - Tang, Dawei

AU - Gao, Feng

AU - Jiang, Xiangqian

PY - 2016

Y1 - 2016

N2 - Surface assurance is one of the main concerns for advanced manufacturing technologies such as Roll- To-Roll (R2R) technique. The undesired defects present on the barrier films make R2R products suffer from a low efficiency and short life span. In order to enhance the performance and the yield of the products, an inspection system enabling in-line metrology of functional surfaces in production lines is desirable to optimise the manufacturing processes. This paper reports an instantaneous line-scan dispersive interferometry which has sufficient resolutions and nano-scale measurement repeatability to detect defects on flexible PV films. Free from any mechanical scanning and obtaining a surface profile in a single shot allows this setup to minimise environmental effects and to be used on the shop floor. The captured spectral interferogram is analysed using a FFT based algorithm, and the process time can be accelerated through data parallelism using a graphics processing unit (GPU). The performance of the developed system was evaluated experimentally by measuring the polyethylene naphthalate (PEN) films provided by the Centre for Process Innovation (CPI). The experimental details and results are presented in this paper.

AB - Surface assurance is one of the main concerns for advanced manufacturing technologies such as Roll- To-Roll (R2R) technique. The undesired defects present on the barrier films make R2R products suffer from a low efficiency and short life span. In order to enhance the performance and the yield of the products, an inspection system enabling in-line metrology of functional surfaces in production lines is desirable to optimise the manufacturing processes. This paper reports an instantaneous line-scan dispersive interferometry which has sufficient resolutions and nano-scale measurement repeatability to detect defects on flexible PV films. Free from any mechanical scanning and obtaining a surface profile in a single shot allows this setup to minimise environmental effects and to be used on the shop floor. The captured spectral interferogram is analysed using a FFT based algorithm, and the process time can be accelerated through data parallelism using a graphics processing unit (GPU). The performance of the developed system was evaluated experimentally by measuring the polyethylene naphthalate (PEN) films provided by the Centre for Process Innovation (CPI). The experimental details and results are presented in this paper.

KW - Defect detection

KW - Dispersive interferometry

KW - Phase slope

KW - Photovoltaic film

UR - http://www.scopus.com/inward/record.url?scp=84984660763&partnerID=8YFLogxK

UR - http://www.euspen.eu/events/16th-international-conference-exhibition/

UR - https://www.amazon.co.uk/Proceedings-International-Engineering-Nanotechnology-proceedings/dp/0956679080/ref=sr_1_1?keywords=9780956679086&qid=1553695171&s=gateway&sr=8-1

M3 - Conference contribution

BT - Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology

A2 - Leach, R.

PB - euspen

ER -

Tang D, Gao F, Jiang X. Implementation of line-scan dispersive interferometry for defect detection. In Leach R, editor, Proceedings of the 16th International Conference and 18th General Meeting of the European Society for Precision Engineering and Nanotechnology: EUSPEN 2016. euspen. 2016