Implementation of line-scan dispersive interferometry for defect detection

Keyphrases

• Defect Detection 100%
• Dispersive Interferometry 100%
• Line Scan 100%
• Environmental Impact 50%
• Process Innovation 50%
• Functional Surface 50%
• Product Yield 50%
• Short Lifetime 50%
• System Development 50%
• Surface Profile 50%
• Manufacturing Process 50%
• Barrier Film 50%
• Roll-to-roll 50%
• Inspection System 50%
• Flexible PV 50%
• Measurement Repeatability 50%
• FFT Method 50%
• Mechanical Scanning 50%
• Spectral Interferogram 50%
• Low Efficiency 50%
• Data Parallelism 50%
• Advanced Manufacturing Technologies 50%
• Nanoscale Measurement 50%
• Graphics Processing Unit 50%
• Polyethylene Naphthalate Film 50%
• In-line Metrology 50%

Engineering

• Defect Detection 100%
• Interferometry 100%
• Parallelism 50%
• Surface Profile 50%
• Manufacturing Process 50%
• Repeatability 50%
• Nanoscale 50%
• Barrier Film 50%
• Process Time 50%
• Shop Floor 50%
• Production Line 50%
• Graphics Processing Unit 50%
• Advanced Manufacturing 50%
• Spectral Interferogram 50%
• Scale Measurement 50%