Implementing a grolishing process in Zeeko IRP machines

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

The removal of mid-spatial-frequency errors is a challenging issue in most subaperture polishing technologies. A novel "grolishing" technology has been developed to deal with grinding errors of spatial wavelengths from 1 to 50 mm with the help of power spectral density analysis and filter theory. This grolishing process was implemented on Zeeko's IRP polishing machine, on which all the subsequent polishing was performed. This has greatly reduced the process time. Although different abrasive have been used, the process is self-contained. The process parameters have been optimized to leave an edge upstand of peak-to-valley of 1 μm over a width of 40 mm.

Original languageEnglish
Pages (from-to)6637-6640
Number of pages4
JournalApplied Optics
Volume51
Issue number27
DOIs
Publication statusPublished - 20 Sep 2012
Externally publishedYes

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Polishing
polishing
Polishing machines
Power spectral density
Abrasives
abrasives
grinding
Wavelength
valleys
filters
wavelengths

Cite this

@article{902a9c5136604ae1b3b24d91e62ad084,
title = "Implementing a grolishing process in Zeeko IRP machines",
abstract = "The removal of mid-spatial-frequency errors is a challenging issue in most subaperture polishing technologies. A novel {"}grolishing{"} technology has been developed to deal with grinding errors of spatial wavelengths from 1 to 50 mm with the help of power spectral density analysis and filter theory. This grolishing process was implemented on Zeeko's IRP polishing machine, on which all the subsequent polishing was performed. This has greatly reduced the process time. Although different abrasive have been used, the process is self-contained. The process parameters have been optimized to leave an edge upstand of peak-to-valley of 1 μm over a width of 40 mm.",
author = "Guoyu Yu and David Walker and Hongyu Li",
year = "2012",
month = "9",
day = "20",
doi = "10.1364/AO.51.006637",
language = "English",
volume = "51",
pages = "6637--6640",
journal = "Applied Optics",
issn = "1559-128X",
publisher = "The Optical Society",
number = "27",

}

Implementing a grolishing process in Zeeko IRP machines. / Yu, Guoyu; Walker, David; Li, Hongyu.

In: Applied Optics, Vol. 51, No. 27, 20.09.2012, p. 6637-6640.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Implementing a grolishing process in Zeeko IRP machines

AU - Yu, Guoyu

AU - Walker, David

AU - Li, Hongyu

PY - 2012/9/20

Y1 - 2012/9/20

N2 - The removal of mid-spatial-frequency errors is a challenging issue in most subaperture polishing technologies. A novel "grolishing" technology has been developed to deal with grinding errors of spatial wavelengths from 1 to 50 mm with the help of power spectral density analysis and filter theory. This grolishing process was implemented on Zeeko's IRP polishing machine, on which all the subsequent polishing was performed. This has greatly reduced the process time. Although different abrasive have been used, the process is self-contained. The process parameters have been optimized to leave an edge upstand of peak-to-valley of 1 μm over a width of 40 mm.

AB - The removal of mid-spatial-frequency errors is a challenging issue in most subaperture polishing technologies. A novel "grolishing" technology has been developed to deal with grinding errors of spatial wavelengths from 1 to 50 mm with the help of power spectral density analysis and filter theory. This grolishing process was implemented on Zeeko's IRP polishing machine, on which all the subsequent polishing was performed. This has greatly reduced the process time. Although different abrasive have been used, the process is self-contained. The process parameters have been optimized to leave an edge upstand of peak-to-valley of 1 μm over a width of 40 mm.

UR - http://www.scopus.com/inward/record.url?scp=84866661219&partnerID=8YFLogxK

U2 - 10.1364/AO.51.006637

DO - 10.1364/AO.51.006637

M3 - Article

VL - 51

SP - 6637

EP - 6640

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 27

ER -