In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, Mohamed Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

Research output: Contribution to journalArticle

Original languageEnglish
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume9622
DOIs
Publication statusPublished - 1 Jan 2015

Cite this

@article{49265e6a60144c48bebbe7bbae53d568,
title = "In-situ defect detection systems for R2R flexible PV barrier films",
keywords = "Defects, Interferometry, Photovoltaic and Aluminum Oxide, Surface inspection, Thin-film",
author = "F. Gao and H. Muhamedsalih and D. Tang and Mohamed Elrawemi and L. Blunt and X. Jiang and S. Edge and D. Bird and P. Hollis",
year = "2015",
month = "1",
day = "1",
doi = "10.1117/12.2193140",
language = "English",
volume = "9622",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

In-situ defect detection systems for R2R flexible PV barrier films. / Gao, F.; Muhamedsalih, H.; Tang, D.; Elrawemi, Mohamed; Blunt, L.; Jiang, X.; Edge, S.; Bird, D.; Hollis, P.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 9622, 01.01.2015.

Research output: Contribution to journalArticle

TY - JOUR

T1 - In-situ defect detection systems for R2R flexible PV barrier films

AU - Gao, F.

AU - Muhamedsalih, H.

AU - Tang, D.

AU - Elrawemi, Mohamed

AU - Blunt, L.

AU - Jiang, X.

AU - Edge, S.

AU - Bird, D.

AU - Hollis, P.

PY - 2015/1/1

Y1 - 2015/1/1

KW - Defects

KW - Interferometry

KW - Photovoltaic and Aluminum Oxide

KW - Surface inspection

KW - Thin-film

UR - http://www.scopus.com/inward/record.url?scp=84943562830&partnerID=8YFLogxK

U2 - 10.1117/12.2193140

DO - 10.1117/12.2193140

M3 - Article

VL - 9622

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

ER -