In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, Mohamed Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Film processing procedures by means of Roll-to-Roll (R2R) for barrier coatings can often result in PV barrier films being manufactured with significant quantities of defects, which results in lower efficiency and a short life span. In order to improve the process yield and product efficiency, it is desirable to develop an inspection system that can detect transparent barrier film defects in the production line during film processing. Off-line detection of defects in transparent PV barrier films is difficult and time consuming. Consequently, implementing an accurate in-situ defects inspection system in the production environment is even more challenging, since the requirements on positioning, fast measurement, long term stability and robustness against environmental disturbance are demanding. This paper reports on the development and deployment of two in-situ PV barrier films defect detection systems, one based on wavelength scanning interferometry (WSI) and the other on White Light Channeled Spectral Interferometry (WLCSI), and the integration into an R2R film processing line at the Centre for Process Innovation (CPI). The paper outlines the environmental vibration strategy for both systems, and the developed auto-focusing methodology for WSI. The systems have been tested and characterised and initial results compared to laboratory-based instrumentation are presented.
Original languageEnglish
Title of host publication2015 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Imaging and Processing Technology
EditorsGuangming Shi, Xuelong Li, Bormin Huang
PublisherSPIE
Number of pages9
Volume9622
ISBN (Print)9781628418033
DOIs
Publication statusPublished - 5 Aug 2015
EventInternational Conference on Optical Instruments and Technology 2015 - Beijing, China
Duration: 17 May 201519 May 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9622
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInternational Conference on Optical Instruments and Technology 2015
CountryChina
CityBeijing
Period17/05/1519/05/15

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