In-situ defect detection systems for R2R flexible PV barrier films

F. Gao; H. Muhamedsalih; D. Tang; Mohamed Elrawemi; L. Blunt; X. Jiang; S. Edge; D. Bird; P. Hollis

doi:10.1117/12.2193140

In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, Mohamed Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

National Printable Electronics Centre

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

Film processing procedures by means of Roll-to-Roll (R2R) for barrier coatings can often result in PV barrier films being manufactured with significant quantities of defects, which results in lower efficiency and a short life span. In order to improve the process yield and product efficiency, it is desirable to develop an inspection system that can detect transparent barrier film defects in the production line during film processing. Off-line detection of defects in transparent PV barrier films is difficult and time consuming. Consequently, implementing an accurate in-situ defects inspection system in the production environment is even more challenging, since the requirements on positioning, fast measurement, long term stability and robustness against environmental disturbance are demanding. This paper reports on the development and deployment of two in-situ PV barrier films defect detection systems, one based on wavelength scanning interferometry (WSI) and the other on White Light Channeled Spectral Interferometry (WLCSI), and the integration into an R2R film processing line at the Centre for Process Innovation (CPI). The paper outlines the environmental vibration strategy for both systems, and the developed auto-focusing methodology for WSI. The systems have been tested and characterised and initial results compared to laboratory-based instrumentation are presented.

Original language	English
Title of host publication	2015 International Conference on Optical Instruments and Technology
Subtitle of host publication	Optoelectronic Imaging and Processing Technology
Editors	Guangming Shi, Xuelong Li, Bormin Huang
Publisher	SPIE
Number of pages	9
Volume	9622
ISBN (Print)	9781628418033
DOIs	https://doi.org/10.1117/12.2193140
Publication status	Published - 5 Aug 2015
Event	International Conference on Optical Instruments and Technology 2015 - Beijing, China Duration: 17 May 2015 → 19 May 2015

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	SPIE
Volume	9622
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	International Conference on Optical Instruments and Technology 2015
Country/Territory	China
City	Beijing
Period	17/05/15 → 19/05/15

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy
SDG 9 Industry, Innovation, and Infrastructure

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Cite this

Gao, F., Muhamedsalih, H., Tang, D., Elrawemi, M., Blunt, L., Jiang, X., Edge, S., Bird, D., & Hollis, P. (2015). In-situ defect detection systems for R2R flexible PV barrier films. In G. Shi, X. Li, & B. Huang (Eds.), 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology (Vol. 9622). Article 96220E (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9622). SPIE. https://doi.org/10.1117/12.2193140

Gao, F. ; Muhamedsalih, H. ; Tang, D. et al. / In-situ defect detection systems for R2R flexible PV barrier films. 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology. editor / Guangming Shi ; Xuelong Li ; Bormin Huang. Vol. 9622 SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{49265e6a60144c48bebbe7bbae53d568,

title = "In-situ defect detection systems for R2R flexible PV barrier films",

abstract = "Film processing procedures by means of Roll-to-Roll (R2R) for barrier coatings can often result in PV barrier films being manufactured with significant quantities of defects, which results in lower efficiency and a short life span. In order to improve the process yield and product efficiency, it is desirable to develop an inspection system that can detect transparent barrier film defects in the production line during film processing. Off-line detection of defects in transparent PV barrier films is difficult and time consuming. Consequently, implementing an accurate in-situ defects inspection system in the production environment is even more challenging, since the requirements on positioning, fast measurement, long term stability and robustness against environmental disturbance are demanding. This paper reports on the development and deployment of two in-situ PV barrier films defect detection systems, one based on wavelength scanning interferometry (WSI) and the other on White Light Channeled Spectral Interferometry (WLCSI), and the integration into an R2R film processing line at the Centre for Process Innovation (CPI). The paper outlines the environmental vibration strategy for both systems, and the developed auto-focusing methodology for WSI. The systems have been tested and characterised and initial results compared to laboratory-based instrumentation are presented.",

keywords = "Defects, Interferometry, Photovoltaic and Aluminum Oxide, Surface inspection, Thin-film",

author = "F. Gao and H. Muhamedsalih and D. Tang and Mohamed Elrawemi and L. Blunt and X. Jiang and S. Edge and D. Bird and P. Hollis",

year = "2015",

month = aug,

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doi = "10.1117/12.2193140",

language = "English",

isbn = "9781628418033",

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series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Guangming Shi and Xuelong Li and Bormin Huang",

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Gao, F , Muhamedsalih, H , Tang, D, Elrawemi, M, Blunt, L , Jiang, X, Edge, S, Bird, D & Hollis, P 2015, In-situ defect detection systems for R2R flexible PV barrier films. in G Shi, X Li & B Huang (eds), 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology. vol. 9622, 96220E, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9622, SPIE, International Conference on Optical Instruments and Technology 2015, Beijing, China, 17/05/15. https://doi.org/10.1117/12.2193140

In-situ defect detection systems for R2R flexible PV barrier films. / Gao, F.; Muhamedsalih, H.; Tang, D. et al.
2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology. ed. / Guangming Shi; Xuelong Li; Bormin Huang. Vol. 9622 SPIE, 2015. 96220E (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9622).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - In-situ defect detection systems for R2R flexible PV barrier films

AU - Gao, F.

AU - Muhamedsalih, H.

AU - Tang, D.

AU - Elrawemi, Mohamed

AU - Blunt, L.

AU - Jiang, X.

AU - Edge, S.

AU - Bird, D.

AU - Hollis, P.

PY - 2015/8/5

Y1 - 2015/8/5

N2 - Film processing procedures by means of Roll-to-Roll (R2R) for barrier coatings can often result in PV barrier films being manufactured with significant quantities of defects, which results in lower efficiency and a short life span. In order to improve the process yield and product efficiency, it is desirable to develop an inspection system that can detect transparent barrier film defects in the production line during film processing. Off-line detection of defects in transparent PV barrier films is difficult and time consuming. Consequently, implementing an accurate in-situ defects inspection system in the production environment is even more challenging, since the requirements on positioning, fast measurement, long term stability and robustness against environmental disturbance are demanding. This paper reports on the development and deployment of two in-situ PV barrier films defect detection systems, one based on wavelength scanning interferometry (WSI) and the other on White Light Channeled Spectral Interferometry (WLCSI), and the integration into an R2R film processing line at the Centre for Process Innovation (CPI). The paper outlines the environmental vibration strategy for both systems, and the developed auto-focusing methodology for WSI. The systems have been tested and characterised and initial results compared to laboratory-based instrumentation are presented.

AB - Film processing procedures by means of Roll-to-Roll (R2R) for barrier coatings can often result in PV barrier films being manufactured with significant quantities of defects, which results in lower efficiency and a short life span. In order to improve the process yield and product efficiency, it is desirable to develop an inspection system that can detect transparent barrier film defects in the production line during film processing. Off-line detection of defects in transparent PV barrier films is difficult and time consuming. Consequently, implementing an accurate in-situ defects inspection system in the production environment is even more challenging, since the requirements on positioning, fast measurement, long term stability and robustness against environmental disturbance are demanding. This paper reports on the development and deployment of two in-situ PV barrier films defect detection systems, one based on wavelength scanning interferometry (WSI) and the other on White Light Channeled Spectral Interferometry (WLCSI), and the integration into an R2R film processing line at the Centre for Process Innovation (CPI). The paper outlines the environmental vibration strategy for both systems, and the developed auto-focusing methodology for WSI. The systems have been tested and characterised and initial results compared to laboratory-based instrumentation are presented.

KW - Defects

KW - Interferometry

KW - Photovoltaic and Aluminum Oxide

KW - Surface inspection

KW - Thin-film

UR - https://www.scopus.com/pages/publications/84943562830

U2 - 10.1117/12.2193140

DO - 10.1117/12.2193140

M3 - Conference contribution

AN - SCOPUS:84943562830

SN - 9781628418033

VL - 9622

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - 2015 International Conference on Optical Instruments and Technology

A2 - Shi, Guangming

A2 - Li, Xuelong

A2 - Huang, Bormin

PB - SPIE

T2 - International Conference on Optical Instruments and Technology 2015

Y2 - 17 May 2015 through 19 May 2015

ER -

Gao F , Muhamedsalih H , Tang D, Elrawemi M, Blunt L , Jiang X et al. In-situ defect detection systems for R2R flexible PV barrier films. In Shi G, Li X, Huang B, editors, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology. Vol. 9622. SPIE. 2015. 96220E. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2193140

In-situ defect detection systems for R2R flexible PV barrier films

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