Abstract
Ion irradiation has been observed to induce a macroscopic flattening and in-plane shrinkage of graphene sheets without a complete loss of crystallinity. Electron diffraction studies performed during simultaneous in-situ ion irradiation have allowed identification of the fluence at which the graphene sheet loses long-range order. This approach has facilitated complementary ex-situ investigations, allowing the first atomic resolution scanning transmission electron microscopy images of ion-irradiation induced graphene defect structures together with quantitative analysis of defect densities using Raman spectroscopy.
Original language | English |
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Article number | 6334 |
Number of pages | 7 |
Journal | Scientific Reports |
Volume | 4 |
DOIs | |
Publication status | Published - 6 Oct 2014 |
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Steve Donnelly
- Department of Engineering and Technology - Research Professor
- School of Computing and Engineering
- Ion Beam Centre - Director
Person: Academic