In situ observation of microstructure evolution in 4H-SiC under 3.5 keV He+ irradiation

Qiang Shen, Guang Ran, Jonathan Hinks, Stephen E. Donnelly, Lumin Wang, Ning Li

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Fingerprint

Dive into the research topics of 'In situ observation of microstructure evolution in 4H-SiC under 3.5 keV He+ irradiation'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemistry