In Situ Real-Time Measurement for Micro-Structured Surfaces

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

A fundamentally improved technology for micro structured surface measurement, based on Wavelength Division Multiplexing (WDM) and Graphics Processing Unit (GPU) techniques is introduced. The WDM technique allows phase-to-depth implementation over large measurement ratios (range/resolution) while the GPU technique allows the analysis of the optical interferograms in real-time. This research attempts to create a new kind of full-field measurement to replace electro-mechanical scanning with white-light interferometry and to form a compact system that is fast, robust and suitable for in situ surface measurement. An experimental system has been developed for the manufacture of diamond turned/fly cut micro-structured surfaces on a large drum diamond turning machine (DTM).

LanguageEnglish
Pages563-566
Number of pages4
JournalCIRP Annals - Manufacturing Technology
Volume60
Issue number1
DOIs
Publication statusPublished - 18 Apr 2011

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Surface measurement
Time measurement
Wavelength division multiplexing
Diamonds
Interferometry
Scanning
Graphics processing unit

Cite this

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In Situ Real-Time Measurement for Micro-Structured Surfaces. / Jiang, X.

In: CIRP Annals - Manufacturing Technology, Vol. 60, No. 1, 18.04.2011, p. 563-566.

Research output: Contribution to journalArticle

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