Intelligent Sampling for the Measurement of Structured Surfaces

J. Wang, X. Jiang, L. A. Blunt, P. J. Scott, R. K. Leach

Research output: Contribution to journalArticlepeer-review

47 Citations (Scopus)


Uniform sampling in metrology has known drawbacks such as coherent spectral aliasing and a lack of efficiency in terms of measuring time and data storage. The requirement for intelligent sampling strategies has been outlined over recent years, particularly where the measurement of structured surfaces is concerned. Most of the present research on intelligent sampling has focused on dimensional metrology using coordinate-measuring machines with little reported on the area of surface metrology. In the research reported here, potential intelligent sampling strategies for surface topography measurement of structured surfaces are investigated by using numerical simulation and experimental verification. The methods include the jittered uniform method, low-discrepancy pattern sampling and several adaptive methods which originate from computer graphics, coordinate metrology and previous research by the authors. By combining the use of advanced reconstruction methods and feature-based characterization techniques, the measurement performance of the sampling methods is studied using case studies. The advantages, stability and feasibility of these techniques for practical measurements are discussed.

Original languageEnglish
Article number085006
JournalMeasurement Science and Technology
Issue number8
Publication statusPublished - 10 Jul 2012


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