Abstract
The article investigates the detrimental effect of nonuniform and uniform crack distributions over a solar cell in terms of open-circuit voltage (Voc), short-circuit current density (Jsc), and output power, the latter under a wide range of irradiance conditions. The experimental procedure to detect the cracks relies on electroluminescence (EL) imaging, which is nondestructive and requires a relatively low amount of time. The Griddler software is adopted to translate the EL-taken image into Voc and Jsc maps. The main findings can be summarized as follows: the nonuniformly and uniformly cracked cells are both jeopardized in terms of output power; the loss corresponding to the cell with nonuniform distribution of cracks is increasingly higher than the uniformly cracked counterpart as the irradiance hitting the cells grows; and all cells affected by nonuniform cracks are severely damaged in terms of fingers and rear busbar, which concur to limit the maximum output current.
Original language | English |
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Pages (from-to) | 1684-1693 |
Number of pages | 10 |
Journal | IEEE Transactions on Industrial Informatics |
Volume | 18 |
Issue number | 3 |
Early online date | 11 Jun 2021 |
DOIs | |
Publication status | Published - 1 Mar 2022 |