Abstract
Ion induced bending is a promising controlled technique for manipulating nanoscale structures. However, the underlying mechanism of the process is not well understood. In this letter, we report a detailed study of the bending mechanism of Si nanowires (NWs) under Ga+ irradiation. The microstructural changes in theNWdue to ion beam irradiation are studied and molecular dynamics simulations are used to explore the ion-NWinteraction processes. The simulation results are compared with the microstructural studies of theNW. The investigations inform a generic understanding of the bending process in crystalline materials, which we suggest to be feasible as a versatile manipulation and integration technique in nanotechnology.
| Original language | English |
|---|---|
| Article number | 015002 |
| Number of pages | 8 |
| Journal | Materials Research Express |
| Volume | 2 |
| Issue number | 1 |
| Early online date | 24 Dec 2014 |
| DOIs | |
| Publication status | Published - 1 Jan 2015 |
| Externally published | Yes |
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