@article{f808dfbd058944afbb193d90bd40832a,
title = "Investigation of the correlation between radiographic image quality and surface measurement quality of XCT using frequency response analysis",
abstract = "X-ray computed tomography (XCT) is developing into a dimensional metrology tool. However, its quality control remains challenging due to the unknown correlation between radiographic image quality and surface measurement quality. This paper investigates this correlation by comparing the modulation transfer function (MTF) of radiographic image with the surface amplitude transfer function (SATF). Results indicate that the limit of measurable surface scale can be predicted by MTF10%. While the shape of the filtering effect on XCT measured surface can be predicted from MTF, the measurement error from this effect cannot be predicted due to the influence of surface determination.",
keywords = "X-ray computed tomography, Metrology, Measurement quality control",
author = "Xiao Chen and Shan Lou and Wenjuan Sun and Paul Scott and Jane Jiang",
note = "Funding Information: The authors gratefully acknowledge the UK's EPSRC funding of The Future Advanced Metrology Hub for Sustainable Manufacturing (EP/Z53285X/1). Funding Information: The authors gratefully acknowledge the UK\u2019s EPSRC funding of The Future Advanced Metrology Hub for Sustainable Manufacturing ( EP/Z53285X/1 ). Publisher Copyright: {\textcopyright} 2025 The Authors",
year = "2025",
month = may,
day = "28",
doi = "10.1016/j.cirp.2025.04.031",
language = "English",
journal = "CIRP Annals - Manufacturing Technology",
issn = "0007-8506",
publisher = "Elsevier USA",
}