Ion beam modification of the structure and properties of hexagonal boron nitride: An infrared and X-ray diffraction study

E. Aradi, S. R. Naidoo, D. G. Billing, D. Wamwangi, I. Motochi, T. E. Derry

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The vibrational mode for the cubic symmetry of boron nitride (BN) has been produced by boron ion implantation of hexagonal boron nitride (h-BN). The optimum fluence at 150 keV was found to be 5 × 1014 ions/cm2. The presence of the c-BN phase was inferred using glancing incidence XRD (GIXRD) and Fourier Transform Infrared Spectroscopy (FTIR). After implantation, Fourier Transform Infrared Spectroscopy indicated a peak at 1092 cm-1 which corresponds to the vibrational mode for nanocrystalline BN (nc-BN). The glancing angle XRD pattern after implantation exhibited c-BN diffraction peaks relative to the implantation depth of 0.4 μm.

LanguageEnglish
Pages140-143
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume331
Early online date11 Mar 2014
DOIs
Publication statusPublished - 15 Jul 2014
Externally publishedYes

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Boron nitride
boron nitrides
Ion beams
ion beams
Infrared radiation
X ray diffraction
implantation
diffraction
x rays
Fourier transform infrared spectroscopy
vibration mode
infrared spectroscopy
Ion implantation
Boron
ion implantation
fluence
boron
incidence
Diffraction
Ions

Cite this

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abstract = "The vibrational mode for the cubic symmetry of boron nitride (BN) has been produced by boron ion implantation of hexagonal boron nitride (h-BN). The optimum fluence at 150 keV was found to be 5 × 1014 ions/cm2. The presence of the c-BN phase was inferred using glancing incidence XRD (GIXRD) and Fourier Transform Infrared Spectroscopy (FTIR). After implantation, Fourier Transform Infrared Spectroscopy indicated a peak at 1092 cm-1 which corresponds to the vibrational mode for nanocrystalline BN (nc-BN). The glancing angle XRD pattern after implantation exhibited c-BN diffraction peaks relative to the implantation depth of 0.4 μm.",
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Ion beam modification of the structure and properties of hexagonal boron nitride : An infrared and X-ray diffraction study. / Aradi, E.; Naidoo, S. R.; Billing, D. G.; Wamwangi, D.; Motochi, I.; Derry, T. E.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 331, 15.07.2014, p. 140-143.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Ion beam modification of the structure and properties of hexagonal boron nitride

T2 - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

AU - Aradi, E.

AU - Naidoo, S. R.

AU - Billing, D. G.

AU - Wamwangi, D.

AU - Motochi, I.

AU - Derry, T. E.

N1 - No full text in Eprints. HN 23/11/2017

PY - 2014/7/15

Y1 - 2014/7/15

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AB - The vibrational mode for the cubic symmetry of boron nitride (BN) has been produced by boron ion implantation of hexagonal boron nitride (h-BN). The optimum fluence at 150 keV was found to be 5 × 1014 ions/cm2. The presence of the c-BN phase was inferred using glancing incidence XRD (GIXRD) and Fourier Transform Infrared Spectroscopy (FTIR). After implantation, Fourier Transform Infrared Spectroscopy indicated a peak at 1092 cm-1 which corresponds to the vibrational mode for nanocrystalline BN (nc-BN). The glancing angle XRD pattern after implantation exhibited c-BN diffraction peaks relative to the implantation depth of 0.4 μm.

KW - Boron nitride

KW - Fourier Transform Infrared Spectroscopy

KW - Glancing incidence XRD

KW - Ion implantation

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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