Abstract
We combine image-processing techniques with a powerful new statistical technique to detect linear pattern production faults in woven textiles. Our approach detects a linear pattern in preprocessed images via model-based clustering. It employs an approximate Bayes factor which provides a criterion for assessing the evidence for the presence of a defect. The model used in experimentation is a (possibly highly elliptical) Gaussian cloud superimposed on Poisson clutter. Results are shown for some representative examples, and contrasted with a Hough transform. Software for the statistical modeling is available.
Original language | English |
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Pages (from-to) | 1539-1548 |
Number of pages | 10 |
Journal | Pattern Recognition Letters |
Volume | 18 |
Issue number | 14 |
DOIs | |
Publication status | Published - Dec 1997 |
Externally published | Yes |