Local Arsenic Structure in Shallow Implants in Si following SPER: An EXAFS and MEIS study

G. Pepponi, D. Giubertoni, S. Gennaro, M. Bersani, M. Anderle, R. Grisenti, M. Werner, J. A. Van Den Berg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Solid phase epitaxial regrowth (SPER) has been investigated in the last few years as a possible method to form ultra shallow dopant distributions in silicon with a high level of electrical. Despite the interest for this process, few investigations were related to arsenic. Apart from the fact that it is easier to form shallow distribution with arsenic than with boron, it is also well known that at the moderate temperatures implied by SPER (500-700°C) arsenic easily deactivates, probably by forming inactive clusters around point defects in silicon. In order to have a better understanding of the SPER process for arsenic implanted silicon in shallow regime, an EXAFS (extended x-ray absorption fine structure) and MEIS (medium energy ion scattering) study is reported in this paper. Silicon samples were implanted at 3 keV with arsenic ions (dose was 2E15 at/cm2 producing a 11 nm amorphous layer) and then annealed in nitrogen at temperatures ranging from 500 to 700°C to have different levels of recrystallisation. From the comparison of the recrystallised fraction as measured by MEIS with the electrical activation measured by Hall effect it results evident that a full regrowth of the lattice is not reflected by a high electrical activation. The activated arsenic corresponds to less than one third of the apparently substitutional dopant for all the samples analyzed. This lack of activation was further investigated by EXAFS: the samples that according to MEIS are fully recrystallised do not reveal a clear local order around As atoms suggesting that either the As atoms are not yet completely relocated within the lattice sites or a deactivation occurred resulting in a more disordered local structure.

Original languageEnglish
Title of host publicationION IMPLANTATION TECHNOLOGY
Subtitle of host publication16th International Conference on Ion Implantation Technology, IIT 2006
EditorsKaren J. Kirkby, Russell M. Gwilliam, Andy Smith, David Chivers
PublisherAmerican Institute of Physics Publising LLC
Pages117-120
Number of pages4
Volume866
ISBN (Print)9780735403659
DOIs
Publication statusPublished - 13 Nov 2006
Externally publishedYes
EventIon Implantation Technology: 16th International Conference on Ion Implantation Technology - Marseille, France
Duration: 11 Jun 200616 Nov 2006
Conference number: 16
https://www.amazon.co.uk/Ion-Impantation-Technology-International-Instrumentations/dp/0735403651

Publication series

NameAIP Conference Proceedings
Volume866
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceIon Implantation Technology: 16th International Conference on Ion Implantation Technology
Abbreviated titleIIT2006
CountryFrance
CityMarseille
Period11/06/0616/11/06
Internet address

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Cite this

Pepponi, G., Giubertoni, D., Gennaro, S., Bersani, M., Anderle, M., Grisenti, R., ... Van Den Berg, J. A. (2006). Local Arsenic Structure in Shallow Implants in Si following SPER: An EXAFS and MEIS study. In K. J. Kirkby, R. M. Gwilliam, A. Smith, & D. Chivers (Eds.), ION IMPLANTATION TECHNOLOGY: 16th International Conference on Ion Implantation Technology, IIT 2006 (Vol. 866, pp. 117-120). (AIP Conference Proceedings; Vol. 866). American Institute of Physics Publising LLC. https://doi.org/10.1063/1.2401475