Low energy ion scattering as a probe of neon radiation damage in nickel

S. E. Donnelly, R. G. Elliman, D. J. O'Connor, R. J. MacDonald

Research output: Contribution to journalArticle

Abstract

The channelling of low energy (keV) hydrogen ions in double alignment geometry has been used to probe damage induced in a (110) nickel specimen by low energy neon irradiation. The channelling spectra, which exhibit a clear surface peak. yield information on both surface and near-surface radiation damage. We present results on sub-surface damage build up, as a function of fluence at different neon energies, which clearly indicate sensitivity to damage level and depth. Asymmetries observed in ion yields along crystallographically equivalent direction are discussed in terms of possible damage configurations.

LanguageEnglish
Pages130-133
Number of pages4
JournalNuclear Inst. and Methods in Physics Research, B
Volume15
Issue number1-6
DOIs
Publication statusPublished - 1 Apr 1986
Externally publishedYes

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Neon
Radiation damage
ion scattering
radiation damage
neon
Nickel
nickel
Scattering
damage
probes
Ions
energy
hydrogen ions
fluence
alignment
asymmetry
Irradiation
Hydrogen
irradiation
Geometry

Cite this

Donnelly, S. E. ; Elliman, R. G. ; O'Connor, D. J. ; MacDonald, R. J. / Low energy ion scattering as a probe of neon radiation damage in nickel. In: Nuclear Inst. and Methods in Physics Research, B. 1986 ; Vol. 15, No. 1-6. pp. 130-133.
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Low energy ion scattering as a probe of neon radiation damage in nickel. / Donnelly, S. E.; Elliman, R. G.; O'Connor, D. J.; MacDonald, R. J.

In: Nuclear Inst. and Methods in Physics Research, B, Vol. 15, No. 1-6, 01.04.1986, p. 130-133.

Research output: Contribution to journalArticle

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