Abstract
We address the problems of (i) segmenting coarse from fine granularity materials, and (ii) discriminating between materials of different granularities. For the former we use wavelet features, and an enhanced version of the widely used EM algorithm. A weighted Gaussian mixture model is used, with a second order spatial neighborhood. For granularity discrimination we investigate the use of multiresolution entropy. We illustrate the good results obtained with a number of practical cases.
Original language | English |
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Title of host publication | Opto-Ireland 2002 |
Subtitle of host publication | Optical Metrology, Imaging, and Machine Vision |
Editors | Andrew Shearer, Fionn D. Murtagh, James Mahon, Paul F. Whelan |
Publisher | SPIE |
Pages | 264-270 |
Number of pages | 7 |
Volume | 4877 |
ISBN (Print) | 0819446580, 9780819446589 |
DOIs | |
Publication status | Published - 19 Mar 2003 |
Externally published | Yes |
Event | Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision - Galway, Ireland Duration: 5 Sep 2002 → 6 Sep 2002 https://www.researchgate.net/publication/260899755_Opto-Ireland_2002_Optical_Metrology_Imaging_and_Machine_Vision |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Publisher | SPIE |
Volume | 4877 |
ISSN (Print) | 0277-786X |
Conference
Conference | Opto-Ireland 2002: Optical metrology, Imaging, and Machine Vision |
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Country/Territory | Ireland |
City | Galway |
Period | 5/09/02 → 6/09/02 |
Internet address |