Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures

X. Q. Jiang, C. F. Cheung, T. C. Kwok, S. To, W. B. Lee, H. F. Li

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

This paper presents a study of effect of cutting conditions on surface quality in FTS machining of optical microstructures such as micro-lens array. A power spectrum analysis is proposed to characterize the surface quality in FTS machining. It is found that there is a strong relationship between the surface roughness and the power spectrum of the surface profile. This provides an important means for the characterization of surface quality in FTS machining of optical microstructures.

Original languageEnglish
Pages (from-to)517-520
Number of pages4
JournalKey Engineering Materials
Volume381-382
Publication statusPublished - 17 Jul 2008

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Surface properties
Machining
Power spectrum
Microstructure
Spectrum analysis
Lenses
Surface roughness

Cite this

Jiang, X. Q. ; Cheung, C. F. ; Kwok, T. C. ; To, S. ; Lee, W. B. ; Li, H. F. / Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures. In: Key Engineering Materials. 2008 ; Vol. 381-382. pp. 517-520.
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Measurement and Characterization of Surface Quality in Fast Tool Servo Machining of Optical Microstructures. / Jiang, X. Q.; Cheung, C. F.; Kwok, T. C.; To, S.; Lee, W. B.; Li, H. F.

In: Key Engineering Materials, Vol. 381-382, 17.07.2008, p. 517-520.

Research output: Contribution to journalArticle

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AU - Cheung, C. F.

AU - Kwok, T. C.

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AU - Lee, W. B.

AU - Li, H. F.

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