Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis

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Abstract

In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.
Original languageEnglish
Title of host publicationProceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology
EditorsF. Chevrier, T. Taliercio, P. Falgayrettes, P. Gall-Borrut
Publishereuspen
Pages254-248
Number of pages4
Volume1
ISBN (Print)9299003505
Publication statusPublished - 2005
Event5th International Conference of the European Society for Precision Engineering and Nanotechnology - Montpellier, France
Duration: 8 May 200511 May 2005
Conference number: 5

Conference

Conference5th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated titleEUSPEN 2005
CountryFrance
CityMontpellier
Period8/05/0511/05/05

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Zeng, W., Jiang, J., Scott, P., & Blunt, L. (2005). Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis. In F. Chevrier, T. Taliercio, P. Falgayrettes, & P. Gall-Borrut (Eds.), Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology (Vol. 1, pp. 254-248). euspen.