In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.
|Title of host publication||Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology|
|Editors||F. Chevrier, T. Taliercio, P. Falgayrettes, P. Gall-Borrut|
|Number of pages||4|
|Publication status||Published - 2005|
|Event||5th International Conference of the European Society for Precision Engineering and Nanotechnology - Montpellier, France|
Duration: 8 May 2005 → 11 May 2005
Conference number: 5
|Conference||5th International Conference of the European Society for Precision Engineering and Nanotechnology|
|Abbreviated title||EUSPEN 2005|
|Period||8/05/05 → 11/05/05|
Zeng, W., Jiang, J., Scott, P., & Blunt, L. (2005). Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis. In F. Chevrier, T. Taliercio, P. Falgayrettes, & P. Gall-Borrut (Eds.), Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology (Vol. 1, pp. 254-248). euspen.