Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis

Wenhan Zeng; Jane Jiang; Paul Scott; Liam Blunt

Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis

Wenhan Zeng, Jane Jiang, Paul Scott, Liam Blunt

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.

Original language	English
Title of host publication	Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology
Editors	F. Chevrier, T. Taliercio, P. Falgayrettes, P. Gall-Borrut
Publisher	euspen
Pages	254-248
Number of pages	4
Volume	1
ISBN (Print)	9299003505
Publication status	Published - 2005
Event	5th International Conference of the European Society for Precision Engineering and Nanotechnology - Montpellier, France Duration: 8 May 2005 → 11 May 2005 Conference number: 5

Conference

Conference	5th International Conference of the European Society for Precision Engineering and Nanotechnology
Abbreviated title	EUSPEN 2005
Country/Territory	France
City	Montpellier
Period	8/05/05 → 11/05/05

Cite this

@inproceedings{7be297d3a3514c608aaec04760425cbc,

title = "Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis",

abstract = "In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.",

keywords = "Wavelet transfoms, Discrete wavelet transforms, Dual-tree complex",

author = "Wenhan Zeng and Jane Jiang and Paul Scott and Liam Blunt",

year = "2005",

language = "English",

isbn = "9299003505",

volume = "1",

pages = "254--248",

editor = "F. Chevrier and T. Taliercio and P. Falgayrettes and P. Gall-Borrut",

booktitle = "Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology",

publisher = "euspen",

address = "United Kingdom",

note = "5th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2005 ; Conference date: 08-05-2005 Through 11-05-2005",

}

Zeng, W , Jiang, J , Scott, P & Blunt, L 2005, Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis. in F Chevrier, T Taliercio, P Falgayrettes & P Gall-Borrut (eds), Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology. vol. 1, euspen, pp. 254-248, 5th International Conference of the European Society for Precision Engineering and Nanotechnology, Montpellier, France, 8/05/05.

Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis. / Zeng, Wenhan ; Jiang, Jane ; Scott, Paul et al.
Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology. ed. / F. Chevrier; T. Taliercio; P. Falgayrettes; P. Gall-Borrut. Vol. 1 euspen, 2005. p. 254-248.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis

AU - Zeng, Wenhan

AU - Jiang, Jane

AU - Scott, Paul

AU - Blunt, Liam

N1 - Conference code: 5

PY - 2005

Y1 - 2005

N2 - In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.

AB - In this paper, the authors investigate the detailed metrological characteristics of the Dual tree Complex wavelet transform (DT-CWT). The results show that the DT-CWT not only is a finite impulse response, perfect reconstruction filter, but also has very good phase property with zero phase shift, and has a very near brick wall property, which means that by using DT-CWT filtering, the filtering result has no aliasing and can separate different frequency components more precisely. Numerical experiments and practical surface data analysis show these remarkable properties.

KW - Wavelet transfoms

KW - Discrete wavelet transforms

KW - Dual-tree complex

UR - https://www.euspen.eu/

UR - https://www.tib.eu/en/search/id/TIBKAT%3A490025501/Proceedings-of-the-5th-international-conference/

UR - https://www.scopus.com/pages/publications/84919881855

M3 - Conference contribution

SN - 9299003505

VL - 1

SP - 254

EP - 248

BT - Proceedings of the 5th International Conference of the European Society for Precision Rngineering and nanotechnology

A2 - Chevrier, F.

A2 - Taliercio, T.

A2 - Falgayrettes, P.

A2 - Gall-Borrut, P.

PB - euspen

T2 - 5th International Conference of the European Society for Precision Engineering and Nanotechnology

Y2 - 8 May 2005 through 11 May 2005

ER -

Metrological Characteristics of Complex Wavelet Transform for Surface Topography Analysis

Abstract

Conference

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